| Literature DB >> 28328224 |
Fabian Schuster1, Jonas Kapraun1, Gilliard N Malheiros-Silveira1, Saniya Deshpande1, Connie J Chang-Hasnain1.
Abstract
In this Letter, we report the site-controlled growth of InP nanolasers on a silicon substrate with patterned SiO2 nanomasks by low-temperature metal-organic chemical vapor deposition, compatible with silicon complementary metal-oxide-semiconductor (CMOS) post-processing. A two-step growth procedure is presented to achieve smooth wurtzite faceting of vertical nanopillars. By incorporating InGaAs multiquantum wells, the nanopillar emission can be tuned over a wide spectral range. Enhanced quality factors of the intrinsic InP nanopillar cavities promote lasing at 0.87 and 1.21 μm, located within two important optical telecommunication bands. This is the first demonstration of a site-controlled III-V nanolaser monolithically integrated on silicon with a silicon-transparent emission wavelength, paving the way for energy-efficient on-chip optical links at typical telecommunication wavelengths.Entities:
Keywords: InGaAs; InP; Site-selective growth; laser; nanopillars; quantum well
Year: 2017 PMID: 28328224 DOI: 10.1021/acs.nanolett.7b00607
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189