Literature DB >> 28328025

Calibration procedure for secular frequency scanning in ion trap mass spectrometers.

Dalton T Snyder1, Christopher J Pulliam1, R Graham Cooks1.   

Abstract

RATIONALE: Mass spectra can be recorded using ion traps by scanning the frequency of an alternating current (ac) signal that corresponds to the secular frequency of a trapped ion. There is a considerable simplification in the instrumentation needed to perform such a scan compared with conventional scans of the radiofrequency (rf) amplitude. However, mass calibration is difficult. An algorithm that can be used to achieve mass calibration is investigated and the factors that affect ion mass assignments are discussed.
METHODS: Time domain data, recorded using a commercial benchtop linear ion trap mass spectrometer, are converted to the m/z domain using ion Mathieu parameter qu values which are derived from the dimensionless frequency parameter βu expressed as a continuing fraction in terms of qu . The relationship between the operating parameters of an ideal ion trap and the ion m/z ratio is derived from the Mathieu equations and expressed as an algorithm which through successive approximations yields the Mathieu qu value and hence m/z values and peak widths. The predictions of the algorithm are tested against experiment by sweeping the frequency of a small supplementary ac signal so as to cause mass-selective ejection of trapped ions.
RESULTS: Calibration accuracy is always better than 0.1%, often much better. Peak widths correspond to a mass resolution of 250 to 500 in the m/z 100-1800 range in secular frequency scans.
CONCLUSIONS: A simple, effective method of calibration of mass spectra recorded using secular frequency scans is achieved. The effects of rf amplitude, scan rate, and ac amplitude on calibration parameters are shown using LTQ linear ion trap data. Corrections for differences in ion mass must be made for accurate calibration, and this is easily incorporated into the calibration procedure.
Copyright © 2016 John Wiley & Sons, Ltd. Copyright © 2016 John Wiley & Sons, Ltd.

Year:  2016        PMID: 28328025     DOI: 10.1002/rcm.7550

Source DB:  PubMed          Journal:  Rapid Commun Mass Spectrom        ISSN: 0951-4198            Impact factor:   2.419


  5 in total

1.  Experimental Characterization of Secular Frequency Scanning in Ion Trap Mass Spectrometers.

Authors:  Dalton T Snyder; Christopher J Pulliam; Joshua S Wiley; Jason Duncan; R Graham Cooks
Journal:  J Am Soc Mass Spectrom       Date:  2016-03-31       Impact factor: 3.109

2.  Successive Resonances for Ion Ejection at Arbitrary Frequencies in an Ion Trap.

Authors:  Dalton T Snyder; R Graham Cooks
Journal:  J Am Soc Mass Spectrom       Date:  2016-09-06       Impact factor: 3.109

3.  Precursor and Neutral Loss Scans in an RF Scanning Linear Quadrupole Ion Trap.

Authors:  Dalton T Snyder; Lucas J Szalwinski; Robert L Schrader; Valentina Pirro; Ryan Hilger; R Graham Cooks
Journal:  J Am Soc Mass Spectrom       Date:  2018-03-09       Impact factor: 3.109

4.  Ion Isolation in a Linear Ion Trap Using Dual Resonance Frequencies.

Authors:  Dalton T Snyder; R Graham Cooks
Journal:  J Am Soc Mass Spectrom       Date:  2016-09-19       Impact factor: 3.109

5.  Single Analyzer Precursor Ion Scans in a Linear Quadrupole Ion Trap Using Orthogonal Double Resonance Excitation.

Authors:  Dalton T Snyder; R Graham Cooks
Journal:  J Am Soc Mass Spectrom       Date:  2017-06-02       Impact factor: 3.109

  5 in total

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