| Literature DB >> 28131929 |
Hans S Schroder1, Megan E Fisher2, Yanli Lin2, Sharon L Lo2, Judith H Danovitch3, Jason S Moser2.
Abstract
Individuals who believe intelligence is malleable (a growth mindset) are better able to bounce back from failures than those who believe intelligence is immutable. Event-related potential (ERP) studies among adults suggest this resilience is related to increased attention allocation to errors. Whether this mechanism is present among young children remains unknown, however. We therefore evaluated error-monitoring ERPs among 123 school-aged children while they completed a child-friendly go/no-go task. As expected, higher attention allocation to errors (indexed by larger error positivity, Pe) predicted higher post-error accuracy. Moreover, replicating adult work, growth mindset was related to greater attention to mistakes (larger Pe) and higher post-error accuracy. Exploratory moderation analyses revealed that growth mindset increased post-error accuracy for children who did not attend to their errors. Together, these results demonstrate the combined role of growth mindset and neural mechanisms of attention allocation in bouncing back after failure among young children.Entities:
Keywords: Error monitoring; Error positivity; Event-related potential; Implicit theories of intelligence; Mindset
Mesh:
Year: 2017 PMID: 28131929 PMCID: PMC6987755 DOI: 10.1016/j.dcn.2017.01.004
Source DB: PubMed Journal: Dev Cogn Neurosci ISSN: 1878-9293 Impact factor: 6.464
Descriptive statistics of behavioral and ERP variables.
| Variable | M | SD | Range |
|---|---|---|---|
| Number of False Alarms | 32.48 | 10.49 | 12.00–60.00 |
| Number of Correct Hits | 235.41 | 5.16 | 202.00–240.00 |
| Number of Correct Rejects | 47.64 | 10.50 | 20.00–68.00 |
| Number of Misses | 4.44 | 5.18 | 0–38.00 |
| False Alarm (FA) RT (ms) | 418.11 | 50.00 | 313.04–557.09 |
| Correct Hit (CH) RT (ms) | 510.96 | 59.93 | 371.62–679.92 |
| Post-FA CH RT (ms) | 538.53 | 81.87 | 346.25–756.21 |
| Post-CH CH RT (ms) | 503.85 | 62.08 | 354.43–687.97 |
| Post-Error Slowing (ms) | 34.68 | 51.49 | −132.76 to 190.91 |
| Post-Error Accuracy (%) | 88.08 | 8.00 | 60.00–100.00 |
| Post-Correct Accuracy (%) | 88.52 | 4.08 | 77.78–97.25 |
| Post-Error Accuracy Difference (%) | −0.44 | 8.49 | −30.35 to 15.29 |
| FCz ERN (μV) | −3.30 | 6.02 | −22.00 to 13.00 |
| FCz CRN (μV) | 4.86 | 3.79 | −5.53 to 15.03 |
| FCz ΔERN (μV) | −8.16 | 5.50 | −23.35 to 6.00 |
| Pz Pe (μV) | 5.16 | 5.60 | −14.17 to 17.03 |
| Pz Pe-Correct (μV) | −2.94 | 4.75 | −15.00 to 9.07 |
| Pz ΔPe (μV) | 8.11 | 5.45 | −4.06 to 24.23 |
Fig. 1Top: Grand averaged response-locked waveforms pooled across five midline sites (Fz, FCz, Cz, CPz, Pz). Time 0 is response onset. Bottom: Scatter plot depicting the relation between growth mindset endorsement and Pe difference amplitude pooled across five midline sites.
Brain-behavior correlations.
| Growth Mindset | Pe Error | Pe | Pe Difference | Post-Error Accuracy | Post-Correct Accuracy | Post-Error Accuracy Difference | |
|---|---|---|---|---|---|---|---|
| Growth Mindset | – | ||||||
| Pe Error | 0.12 | – | |||||
| Pe Correct | −0.08 | 0.45 | – | ||||
| Pe Difference | 0.20 | 0.71 | −0.30 | – | |||
| Post-Error Accuracy | 0.23 | 0.27 | 0.17 | 0.16 | – | ||
| Post-Correct Accuracy | 0.11 | 0.09 | −0.01 | 0.10 | 0.13 | – | |
| Post-Error Accuracy Difference | 0.17 | 0.22 | 0.17 | 0.10 | 0.88 | −0.36 | – |
Note: Pe variables here were pooled across five midline sites (Fz, FCz, Cz, CPz, Pz).
p < 0.05.
p < 0.01.
Regression model predicting post-error accuracy.
| Predictor | Δ | β | 95% Confidence Interval (Lower, Upper) for | |||
|---|---|---|---|---|---|---|
| Overall Model | 0.11 | – | – | – | – | 0.003 |
| Growth Mindset | 0.20 | 0.02 | 0.002, 0.03 | 0.03 | ||
| Pe difference | 0.15 | 0.002 | −0.0004, 0.005 | 0.10 | ||
| Mindset x Pe difference | 0.04 | −0.21 | −0.004 | −0.007, −0.001 | 0.02 |
Note: Pe variables were pooled across five midline sites.
Fig. 2Relations between mindset and post-error accuracy differ by Pe difference amplitude.