Literature DB >> 27824473

Field-Driven Mott Gap Collapse and Resistive Switch in Correlated Insulators.

G Mazza1,2,3, A Amaricci4, M Capone1, M Fabrizio1.   

Abstract

Mott insulators are "unsuccessful metals" in which Coulomb repulsion prevents charge conduction despite a metal-like concentration of conduction electrons. The possibility to unlock the frozen carriers with an electric field offers tantalizing prospects of realizing new Mott-based microelectronic devices. Here we unveil how such unlocking happens in a simple model that shows the coexistence of a stable Mott insulator and a metastable metal. Considering a slab subject to a linear potential drop, we find, by means of the dynamical mean-field theory, that the electric breakdown of the Mott insulator occurs via a first-order insulator-to-metal transition characterized by an abrupt gap collapse in sharp contrast to the standard Zener breakdown. The switch on of conduction is due to the field-driven stabilization of the metastable metallic phase. Outside the region of insulator-metal coexistence, the electric breakdown occurs through a more conventional quantum tunneling across the Hubbard bands tilted by the field. Our findings rationalize recent experimental observations and may offer a guideline for future technological research.

Entities:  

Year:  2016        PMID: 27824473      PMCID: PMC5423525          DOI: 10.1103/PhysRevLett.117.176401

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  17 in total

1.  High-spin to low-spin and orbital polarization transitions in multiorbital Mott systems.

Authors:  Philipp Werner; Andrew J Millis
Journal:  Phys Rev Lett       Date:  2007-09-19       Impact factor: 9.161

2.  Steady-state nonequilibrium density of States of driven strongly correlated lattice models in infinite dimensions.

Authors:  A V Joura; J K Freericks; Th Pruschke
Journal:  Phys Rev Lett       Date:  2008-11-03       Impact factor: 9.161

3.  Dielectric breakdown of Mott insulators in dynamical mean-field theory.

Authors:  Martin Eckstein; Takashi Oka; Philipp Werner
Journal:  Phys Rev Lett       Date:  2010-09-28       Impact factor: 9.161

4.  Collective bulk carrier delocalization driven by electrostatic surface charge accumulation.

Authors:  M Nakano; K Shibuya; D Okuyama; T Hatano; S Ono; M Kawasaki; Y Iwasa; Y Tokura
Journal:  Nature       Date:  2012-07-25       Impact factor: 49.962

5.  Avalanche breakdown in GaTa4Se(8-x)Te(x) narrow-gap Mott insulators.

Authors:  V Guiot; L Cario; E Janod; B Corraze; V Ta Phuoc; M Rozenberg; P Stoliar; T Cren; D Roditchev
Journal:  Nat Commun       Date:  2013       Impact factor: 14.919

6.  Universal electric-field-driven resistive transition in narrow-gap Mott insulators.

Authors:  Pablo Stoliar; Laurent Cario; Etiene Janod; Benoit Corraze; Catherine Guillot-Deudon; Sabrina Salmon-Bourmand; Vincent Guiot; Julien Tranchant; Marcelo Rozenberg
Journal:  Adv Mater       Date:  2013-05-06       Impact factor: 30.849

7.  First-order insulator-to-metal Mott transition in the paramagnetic 3D system GaTa4Se8.

Authors:  A Camjayi; C Acha; R Weht; M G Rodríguez; B Corraze; E Janod; L Cario; M J Rozenberg
Journal:  Phys Rev Lett       Date:  2014-08-21       Impact factor: 9.161

8.  Subnanosecond incubation times for electric-field-induced metallization of a correlated electron oxide.

Authors:  Justin S Brockman; Li Gao; Brian Hughes; Charles T Rettner; Mahesh G Samant; Kevin P Roche; Stuart S P Parkin
Journal:  Nat Nanotechnol       Date:  2014-04-20       Impact factor: 39.213

9.  Universality and critical behavior at the Mott transition.

Authors:  P Limelette; A Georges; D Jérome; P Wzietek; P Metcalf; J M Honig
Journal:  Science       Date:  2003-10-03       Impact factor: 47.728

10.  Electric-field-induced metal maintained by current of the Mott insulator Ca2RuO4.

Authors:  Fumihiko Nakamura; Mariko Sakaki; Yuya Yamanaka; Sho Tamaru; Takashi Suzuki; Yoshiteru Maeno
Journal:  Sci Rep       Date:  2013       Impact factor: 4.379

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