| Literature DB >> 27582300 |
Jagdeep Kaur1, John Fellers2, Alok Adholeya3, Siva L S Velivelli4, Kaoutar El-Mounadi4,5, Natalya Nersesian6, Thomas Clemente7, Dilip Shah4.
Abstract
Rust fungi of the order Pucciniales are destructive pathogens of wheat worldwide. Leaf rust caused by the obligate, biotrophic basidiomycete fungus Puccinia triticina (Pt) is an economically important disease capable of causing up to 50 % yield losses. Historically, resistant wheat cultivars have been used to control leaf rust, but genetic resistance is ephemeral and breaks down with the emergence of new virulent Pt races. There is a need to develop alternative measures for control of leaf rust in wheat. Development of transgenic wheat expressing an antifungal defensin offers a promising approach to complement the endogenous resistance genes within the wheat germplasm for durable resistance to Pt. To that end, two different wheat genotypes, Bobwhite and Xin Chun 9 were transformed with a chimeric gene encoding an apoplast-targeted antifungal plant defensin MtDEF4.2 from Medicago truncatula. Transgenic lines from four independent events were further characterized. Homozygous transgenic wheat lines expressing MtDEF4.2 displayed resistance to Pt race MCPSS relative to the non-transgenic controls in growth chamber bioassays. Histopathological analysis suggested the presence of both pre- and posthaustorial resistance to leaf rust in these transgenic lines. MtDEF4.2 did not, however, affect the root colonization of a beneficial arbuscular mycorrhizal fungus Rhizophagus irregularis. This study demonstrates that the expression of apoplast-targeted plant defensin MtDEF4.2 can provide substantial resistance to an economically important leaf rust disease in transgenic wheat without negatively impacting its symbiotic relationship with the beneficial mycorrhizal fungus.Entities:
Keywords: Genetic engineering; Leaf rust; MtDEF4.2; Plant defensin; Puccinia triticina; Rhizophagus irregularis
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Year: 2016 PMID: 27582300 PMCID: PMC5243879 DOI: 10.1007/s11248-016-9978-9
Source DB: PubMed Journal: Transgenic Res ISSN: 0962-8819 Impact factor: 2.788
Fig. 1Chimeric MtDef4.2 gene expression cassette and its expression in transgenic wheat. a The monocot codon-optimized MtDef4.2 was placed under the control of the constitutively expressing maize Ubi1A promoter/intron/tobacco etch virus (TEV) mRNA leader sequence and 3′ polyadenylation CaMV35S signal terminates transcription. Plant selectable marker gene NPTII is driven by enhanced CaMV35S promoter and 35S polyadenylation is transcription termination sequence. LB left border; P promoter; NPTII neomycin phosphotransferase II; I intron; SP signal peptide; MP mature peptide; RB right border. b Quantitative RT-PCR of MtDef4.2 in the leaf and root tissue of various transgenic wheat lines. Relative expression levels of MtDef4.2 are reported in logarithmic scale and were normalized to expression of wheat ADP glycosylation gene Ta2291. Error bars represent SE of three different biological replicates
Leaf rust phenotype on non-transgenic and transgenic wheat lines infected with Pt race MCPSS
| Line name | Average infection type (IT) scores at 15 dpia | Host reaction |
|---|---|---|
| BW | 2 | Moderately resistant |
| BW-A-11 | Chlorosis, ;1 | Highly resistant |
| BW-B-4 | ;1 | Highly resistant |
| BW-F-10 | Chlorosis, ; | Highly resistant |
| XC9 | 3 | Moderately susceptible |
| XC9-104 | Fewer pustules to ;1 | Highly resistant |
aScored on 0–4 scale where 0 no visible uredinia, ; (fleck) hypersensitive response, 1 small uredinia with necrosis, 2 small to medium uredinia with green islands surrounded by necrosis or chlorosis, 3 medium uredinia with or without chlorosis, 4 large uredinia without chlorosis per McIntosh et al. (1995)
Fig. 2Photographs and confocal images of the representative leaves of non-transgenic and transgenic wheat lines infected with Pt race MCPSS. a Plants were scored for visual symptoms at 15 dpi and disease ratings were done on 0–4 scale as described in McIntosh et al. (1995). Average IT rating is listed on the top of each leaf. b Confocal microscopic image of XC9 at 2 dpi. c XC9-104-1 at 2 dpi. d XC9 at 4 dpi. e XC9-104-1 at 4 dpi. Between 10–15 leaf segments with infection foci were scanned. U urediniospore; GT germ tube; AP appresorium; HMC haustoria mother cell; SSV substomatal vesicle; IH infection hypha. Scale bar = 50 μm
Fig. 3Representative fluorescence microscopic images of non-transgenic and transgenic wheat lines infected with Pt race MCPSS at 15 dpi. a XC9. b XC9-104-1. c BW. d BW-B-4. e Lesion size calculated using Image J. For lesion size measurements 12, 25, 19, 21 infection colonies for XC9, XC9-104-1, BW and B-4-11, respectively, were assessed. Error bars represent standard error of the means. Data were analyzed using Student’s t test, **** represents significance level at P < 0.0001. Scale bar 0.5 mm
Average AMF colonization of non-transgenic and transgenic wheat lines infected with Ri at 36 dpi from two independent experiments
| Wheat line | Leaf number/ plant | Plant height (cm) | Percent colonizationa | |||
|---|---|---|---|---|---|---|
| Mean ± SEM |
| Mean ± SEM |
| Mean ± SEM |
| |
| BWb | 5 ± 0.20 | – | 21.00 ± 2.41 | – | 15.25 ± 3.28 | – |
| BW-B-4b | 6 ± 0.20 | 0.0341* | 20.70 ± 2.93 | 0.9147 | 14.45 ± 2.77 | 0.8580 |
| XC9b | 7 ± 0.24 | – | 19.50 ± 3.75 | – | 21.50 ± 4.83 | – |
| XC9-104-1b | 6 ± 0.60 | 0.7990 | 15.4 ± 1.88 | 0.3998 | 24.50 ± 6.03 | 0.7024 |
| BW Mockc | 5 ± 0.00 | – | 21.37 ± 0.72 | – | Not applicable | |
| BW-B-4 Mockc | 6 ± 0.17 | 0.0005*** | 23.65 ± 0.72 | 0.0491* | Not applicable | |
| XC9 Mockc | 6 ± 0.63 | – | 22.55 ± 1.12 | – | Not applicable | |
| XC9-104-1 Mockc | 6 ± 0.52 | 1.000 | 19.13 ± 1.39 | 0.1037 | Not applicable | |
aMycorrhizal colonization includes the observations of internal hyphae, arbuscules and vesicles
bEight plants were evaluated for treatment
cSix plants were evaluated for mock
*, *** Indicate significant difference at P = 0.05 and P = 0.001 in the student’s t test