| Literature DB >> 27562015 |
Tao Xu1,2, Weiling Li1, Xicun Gao3, Chang Sun4, Guo Chen1, Xiaowen Zhang5, Chunya Li1, Wenqing Zhu1, Bin Wei6.
Abstract
This paper demonstrates the influence of temperature, exciton concentration, and electron transportation layers on the excimer emission of a novel deep-blue material: 4,4'-bis(4''-triphenylsilyl) phenyl-1,1'-binaphthalene (SiBN), by studying the photoluminescence and electroluminescence spectra of SiBN-based film. We have further developed sunlight-like and warm-light white organic light-emitting diodes (WOLEDs) with high efficiency and wide-range spectra, using SiBN and bis(2-phenylbenzothiozolato-N,C2')iridium(acetylacetonate) (bt2Ir(acac)) as the blue excimer and yellow materials, respectively. The resulting device exhibited an excellent spectra overlap ratio of 82.9 % with sunlight, while the device peak current efficiency, external quantum efficiency, and power efficiency were 18.5 cd/A, 6.34 %, and 11.68 lm/W, respectively, for sunlight-like WOLEDs.Entities:
Keywords: Concentration; Electron transportation layer; Excimer emission; Monomer emission; Sunlight-like WOLEDs
Year: 2016 PMID: 27562015 PMCID: PMC4999381 DOI: 10.1186/s11671-016-1578-3
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703
Fig. 1The absorption and PL spectra of SiBN thin films annealing at room temperature (black), 100 °C (green), and 300 °C (blue) for 30 min; the inset is the molecule structure of SiBN
Fig. 2a The PL spectra of SiBN-doped AND thin films with various concentrations of 1, 5, and 20 wt.% . b The EL spectra of OLEDs using y wt.% SiBN-doped AND thin films as the emitting layers (EMLs) (y = 1, 5 here)
Fig. 3The diagram of exciton formation process in a PL and b EL of AND:SiBN thin films
Fig. 4a The architecture of OLEDs with various ETLs is ITO/HAT-CN (30 nm)/NPB (10 nm)/AND: 5 wt.% SiBN (20 nm)/ETLs (30 nm)/Liq (1 nm)/Al. b The energy diagrams of the devices. c EL spectra of the devices. The inset is the schematic diagrams of exciton recombination zone
Fig. 5a The architectures and b the energy diagrams of WOLEDs. The architectures of devices E and F are ITO/HAT-CN (30 nm)/NPB (10 nm)/W/O or with TCTA (10 nm)/mCP: 8 wt.% bt2Ir(acac) (10 nm)/mCP (5 nm)/AND: 5 wt.% SiBN (20 nm)/TPBi (30 nm)/Liq (1 nm)/Al
Fig. 6a Characteristics of J-V-L for devices E (blue solid circle line) and F (red open square line). b CE-L-EQE curves of devices E (blue solid circle line) and F (red open square line). c EL spectra of devices E and F and the spectrum of sunlight measured by PR650. Blue line for device E, red line for device F, and violet dash line for sunlight. d Gauss multi-peaks fitting for the spectra of device E