| Literature DB >> 27366602 |
Abstract
The optical design and performance of the high-resolution powder diffraction beam line BM16 at ESRF are discussed and illustrated. Some recent studies carried out on BM16 are described, including crystal structure solution and refinement, anomalous scattering, in situ measurements, residual strain in engineering components, investigation of microstructure, and grazing-incidence diffraction from surface layers. The beam line is built on a bending magnet, and operates in the energy range from 5 keV to 40 keV. After the move to an undulator source in 2002, it will benefit from an extented energy range up to 60 keV and increased flux and resolution. It is anticipated that enhancements to the data quality will be achieved, leading to the solution of larger crystal structures, and improvements in the accuracy of refined structures. The systematic exploitation of anisotropic thermal expansion will help reduce the effects of peak overlap in the analysis of powder diffraction data.Entities:
Keywords: Rietveld refinement; anomalous scattering; grazing incidence; microstructure; powder crystallography; residual strain; structural solution; synchrotron radiation; x-ray diffraction
Year: 2004 PMID: 27366602 PMCID: PMC4849623 DOI: 10.6028/jres.109.010
Source DB: PubMed Journal: J Res Natl Inst Stand Technol ISSN: 1044-677X
Fig. 1Spectrum of an ESRF bending magnet per horizontal mrad at 100 mA ring current. The shaded section shows the energy range 5 keV to 40 keV selected for BM16.
Fig. 2Schematic view from above of the idealised optical arrangement on BM16.
Fig. 3The nine-channel Ge 111 multianalyzer stage [2].
Fig. 4Diffraction pattern of Na2Al2Ca3 measured on BM16 at a wavelength of 0.48776 Å (25.42 keV).
Fig. 5Theoretical FWHM of diffraction peaks for BM16 and those obtained from a sample of Na2Ca3Al2F14 at 28 keV ignoring the broadening due to axial divergence. See Ref. [3] for further details.
Fig. 6Asymmetry at low angle with Na2Ca3Al2F14.
Fig. 7The entrance and exit slits, and the analyzer crystal define a gauge volume. The position of a diffraction peak is measured from different parts of the sample, thus mapping the strain distribution.