| Literature DB >> 27247875 |
Md Asaduzzaman1, Mehedi Hasan1, Ali Newaz Bahar1.
Abstract
A simulation study of a Cu(In1 - xGax)Se2 (CIGS) thin film solar cell has been carried out with maximum efficiency of 24.27 % (Voc = 0.856 V, Jsc = 33.09 mA/cm(2) and FF = 85.73 %). This optimized efficiency is obtained by determining the optimum band gap of the absorber and varying the doping concentration of constituent layers. The Ga content denoted by x = Ga/(In + Ga) is selected as 0.35 which provides the optimum band gap of absorber layer as 1.21 eV. Theoretically, the effects of Ga fraction "x" on CIGS absorber band gap are investigated and to avoid the lattice mismatch effect, the efficiency measurements due to the CIGS band gaps >1.21 eV have not come to the consideration. A one-dimensional simulator ADEPT/F 2.1 has been used to analyze the fabricated device parameters and hence to calculate open circuit voltage, short circuit current, fill factor and efficiency.Entities:
Keywords: Absorber band gap; CIGS thin film; Doping concentration; Efficiency; Lattice mismatch
Year: 2016 PMID: 27247875 PMCID: PMC4864869 DOI: 10.1186/s40064-016-2256-8
Source DB: PubMed Journal: Springerplus ISSN: 2193-1801
Fig. 1Schematic diagram of Cu (In1-xGax)Se2 thin film solar cell (The dimensions are not scaled)
The default values of device parameters
| Parameters | N-ZnO | N-CdS | P-CIGS |
|---|---|---|---|
| Thickness (µm) | 0.2 | 0.05 | 3 |
| Dielectric constant | 7.8 | 8.28 | 13.6 |
| Refractive index | 2 | 3.16 | 3.67 |
| Band gap (eV) | 3.3 | 2.42 | 1.15 |
| Electron affinity (eV) | 4.6 | 4.4 | 4.5 |
| Electron mobility (cm2/Vs) | 160 | 350 | 100 |
| Hole mobility (cm2/Vs) | 40 | 50 | 25 |
| Conduction band effective density of states (cm−3) | 2.2 × 1018 | 1.7 × 1019 | 2 × 1018 |
| Valence band effective density of states (cm−3) | 1.8 × 1019 | 2.4 × 1018 | 1.6 × 1019 |
| Donor concentration (cm−3) | 1 × 1018 | 1 × 1018 | 0 |
| Acceptor concentration (cm−3) | 0 | 0 | 2 × 1016 |
| Electron lifetime (s) | 5 × 10−8 | 2 × 10−8 | 1 × 10−8 |
| Hole lifetime (s) | 5 × 10−9 | 6 × 10−8 | 5 × 10−8 |
| Absorption file | zno.a | cds.a | cigs.a |
Contact parameters for device simulation
| Parameters | Front contact | Back contact |
|---|---|---|
| Reflectance | 0.1 | 0.8 |
| Recombination velocity for holes | 107 | 107 |
| Recombination velocity for electrons | 107 | 107 |
Band gap and electron affinity of Cu(In1−xGax)Se2 alloy composition
| Ga/(In + Ga) ratio, x | Band gap, Eg | Electron affinity, χe |
|---|---|---|
| 0.0 | 1.04 | 4.61 |
| 0.3 | 1.20 | 4.25 |
| 0.7 | 1.40 | 3.93 |
| 1.0 | 1.67 | 3.41 |
Fig. 2Variation in band gap and electron affinity due to the change in Ga content
Fig. 3J-V characteristic curve for default values
Performance variation due to absorber band gap
| X | Eg (eV) | χe (eV) | Jsc (mA/cm2) | Voc (V) | FF (%) | η (%) |
|---|---|---|---|---|---|---|
| 0 | 1.04 | 4.61 | 36.43 | 0.529 | 76.70 | 14.79 |
| 0.2 | 1.13 | 4.38 | 36.22 | 0.622 | 77.68 | 17.49 |
| 0.35 | 1.21 | 4.21 | 36.06 | 0.705 | 76.44 | 19.45 |
| 0.55 | 1.33 | 3.98 | 35.84 | 0.828 | 66.60 | 19.77 |
| 0.7 | 1.44 | 3.81 | 35.69 | 0.940 | 55.90 | 18.43 |
| 1 | 1.69 | 3.48 | 35.45 | 1.183 | 32.16 | 13.49 |
Fig. 4Energy band diagram of CIGS thin film
Fig. 5a Doping concentration b Spatially resolved current c Electric field and d J-V characteristic curve for optimum values