Literature DB >> 27082712

An introduction to ion optics for the mass spectrograph.

T W Burgoyne1, G M Hieftje1.   

Abstract

A mass spectrograph is an instrument that separates and simultaneously focuses ions, along a focal plane, of different mass/charge ratios that are diverging in direction and that have a variable velocity. With these instruments and a spatially sensitive ion detector, simultaneous detection can be employed, which has been shown to improve precision and throughput (as compared to a mass spectrometer that can only detect one mass at a time). Knowing how an ion beam focuses throughout the mass spectrograph and onto the focal plane is crucial. We present here rudimentary ion optics of the mass spectrograph in a simple yet useable manner. From there, we investigate the direction and energy focal lines of some mass-spectrograph geometries, using the ion optics presented. Lastly, other mass spectrograph geometries that fall outside the field of knowledge of the ion optics covered are discussed. With this review, we hope to provide an understandable and universal ion optic theory that encompasses a wide range of mass spectrographs and that is palatable to the novice as well as the expert. © 1997 John Wiley & Sons, Inc.
Copyright © 1997 John Wiley & Sons, Inc.

Year:  1996        PMID: 27082712     DOI: 10.1002/(SICI)1098-2787(1996)15:4<241::AID-MAS2>3.0.CO;2-I

Source DB:  PubMed          Journal:  Mass Spectrom Rev        ISSN: 0277-7037            Impact factor:   10.946


  3 in total

1.  Compatibility of Spatially Coded Apertures with a Miniature Mattauch-Herzog Mass Spectrograph.

Authors:  Zachary E Russell; Shane T DiDona; Jason J Amsden; Charles B Parker; Gottfried Kibelka; Michael E Gehm; Jeffrey T Glass
Journal:  J Am Soc Mass Spectrom       Date:  2016-01-07       Impact factor: 3.109

2.  A Theoretical Method for Characterizing Nonlinear Effects in Paul Traps with Added Octopole Field.

Authors:  Caiqiao Xiong; Xiaoyu Zhou; Ning Zhang; Lingpeng Zhan; Yongtai Chen; Suming Chen; Zongxiu Nie
Journal:  J Am Soc Mass Spectrom       Date:  2015-04-30       Impact factor: 3.109

3.  Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM Instruments for Nanoscale Chemical Imaging.

Authors:  Olivier De Castro; Jean-Nicolas Audinot; Hung Quang Hoang; Chérif Coulbary; Olivier Bouton; Rachid Barrahma; Alexander Ost; Charlotte Stoffels; Chengge Jiao; Mikhail Dutka; Michal Geryk; Tom Wirtz
Journal:  Anal Chem       Date:  2022-07-21       Impact factor: 8.008

  3 in total

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