| Literature DB >> 26965713 |
Ke Zhang1, Hui Wang1, Zhikai Gan1, Peiqi Zhou1, Chunlian Mei1, Xu Huang1, Yuxing Xia1.
Abstract
We report substantially enlarged lateral photovoltaic effect (LPE) in the ZnO/Ag/Si nanostructures. The maximum LPE sensitivity (55.05 mv/mm) obtained in this structure is about seven times larger than that observed in the control sample (7.88 mv/mm) of ZnO/Si. We attribute this phenomenon to the strong localized surface plasmon resonances (LSPRs) induced by nano Ag semicontinuous films. Quite different from the traditional LPE in PN junction type structures, in which light-generated carriers contributed to LPE merely depends on direct excitation of light in semiconductor, this work firstly demonstrates that, by introducing a super thin metal Ag in the interface between two different kinds of semiconductors, the nanoscale Ag embedded in the interface will produce strong resonance of localized field, causing extra intraband excitation, interband excitation and an enhanced direct excitation. As a consequence, these LSPRs dominated contributions harvest much more carriers, giving rise to a greatly enhanced LPE. In particular, this LSPRs-driven mechanism constitutes a sharp contrast to the traditional LPE operation mechanism. This work suggests a brand new LSPRs approach for tailoring LPE-based devices and also opens avenues of research within current photoelectric sensors area.Entities:
Year: 2016 PMID: 26965713 PMCID: PMC4786795 DOI: 10.1038/srep22906
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1(a) Specific LPVs from the control sample to sample 4 as a function of laser position with the 405 nm incident laser. The inset shows different sensitivities vs various Ag thickness (Sensitivity here refers to the differential value of the LPV output over the displacement of laser spot). The shadow regions illustrated with gray and reddish color represented the effective linear area and the contact area respectively. (b) Ag thickness-dependence of LPV sensitivities with different laser wavelength (here laser power used is unified as 4 mw). The inset is the schematic diagram of LPV measurement setup. The distance of the two contacts in this letter is identically set up to be 4 mm.
Figure 2(a) Photoluminescence spectra of the silver semicontinuous film mediated ZnO hybrid nanostructures and the control sample ZnO/Si fabricated on N-type Si substrate. The inset shows the schematic drawing of the PL measurement configuration. (b) I-V curves of the nanostructures with different Ag thickness, the inset is the schematic circuit of the sample measurement.
Figure 3(a) The general schematic LPE model of the ZnO/Si nanostructure. (b) Energy band diagram of ZnO/Si (substrate) sample. (c) The schematic mechanism of the surface plasmon polariton induced excitation of interband and intraband transition as well as enhanced photon-induced carriers excitation by the interactions between the incident laser and Ag clusters on ZnO/Ag interface. (d) Energy band diagram of ZnO/Ag/Si samples. (e,f) The 100 nm-scale and 200 nm-scale distribution of the local field intensity simulated by FDTD in this nanostructure.