Maternal Depression Is Related to Reduced Error-Related Brain Activity in Child and Adolescent Offspring.

Chronic parental depression is associated with an increased likelihood of depression in offspring. One mechanism by which parental depression may increase risk is through physiological or cognitive tendencies in offspring. Error processing has been studied using the error-related negativity (ERN), an event-related potential that occurs around the time someone commits an error, and has previously been shown to be heritable and blunted in depressed individuals. The current study examined the ERN as a potential biomarker of risk in a sample of never-depressed children whose mothers had a history of recurrent major depressive disorder (MDD), a single episode of MDD, or no lifetime history of any mood disorder. Seventy-eight mother-child dyads participated. The average age for children was 13.13 years (SD = 2.07) and 50% were female. Diagnostic interviews and self-report questionnaires were used to assess depression in both mothers and children. A flankers task was used to elicit the ERN and the correct response negativity (CRN) in children. Children of mothers with a history of recurrent MDD exhibited a reduced difference between the ERN and CRN compared to children of mothers with no depression history, even after controlling for children's current depression symptoms. Furthermore, current maternal depression symptoms related to a smaller difference between ERN and CRN in children. This pattern of findings suggests that blunted neural activity differentiating error from correct responses may be one mechanism by which recurrent maternal depression increases risk for depression in offspring and may be useful biomarker of risk.