| Literature DB >> 26524321 |
O Mathon1, A Beteva1, J Borrel1, D Bugnazet1, S Gatla1, R Hino1, I Kantor1, T Mairs1, M Munoz1, S Pasternak1, F Perrin1, S Pascarelli1.
Abstract
BM23 is the general-purpose EXAFS bending-magnet beamline at the ESRF, replacing the former BM29 beamline in the framework of the ESRF upgrade. Its mission is to serve the whole XAS user community by providing access to a basic service in addition to the many specialized instruments available at the ESRF. BM23 offers high signal-to-noise ratio EXAFS in a large energy range (5-75 keV), continuous energy scanning for quick-EXAFS on the second timescale and a micro-XAS station delivering a spot size of 4 µm × 4 µm FWHM. It is a user-friendly facility featuring a high degree of automation, online EXAFS data reduction and a flexible sample environment.Entities:
Keywords: ESRF; EXAFS; XANES; XAS beamline; microXAS
Year: 2015 PMID: 26524321 PMCID: PMC4787840 DOI: 10.1107/S1600577515017786
Source DB: PubMed Journal: J Synchrotron Radiat ISSN: 0909-0495 Impact factor: 2.616
BM23 beamline: main characteristics
| Beamline name | BM23 | |
| Source | 0.85 T ESRF bending magnet | |
| Primary slits | 10 mm × 0.3 mm located at 23.5 m | |
| Monochromator | Fixed-exit double-crystal monochromator (DCM) Si(111/311/511) | |
| Mirrors | Double mirrors 2–5 mrad Si/Pt/Rh stripes | |
| Energy range | 5−75 keV | |
| Beam size (unfocused) | 15 mm by 1 mm | |
| Flux on sample (unfocused) | 1.2 × 1011 photons s−1 at 21 keV in 0.35 mrad × 14 µrad at 200 mA using a Si(111) DCM and RH mirrors at 2 mrad | |
| Beam size (focused) | 4 µm × 4 µm (FWHM) using a pair of Pt-coated mirrors in KB geometry | |
| Flux (focused) | 4 × 109 photons s−1 at 21 keV in 0.02 mrad × 10 µrad at 200 mA using a Si(111) DCM and KB mirrors at 3 mrad | |
| Detectors | Ionization chambers, diodes, 13-element Ge detectors, Si drift diodes, MAR 165 CCD | |
| Sample environments | Automatic sample changer, low-temperature (1.6–400 K), high-temperature (300–3000 K), high-pressure (1–100 GPa), high-temperature reactors, plug flow capillary microreactors | |
Measured with a calibrated Si PIN diode.
Figure 1BM23 beamline: optical layout.
Figure 2(a) EXAFS signals k 2χ(k) at the K-edge of Te in CdTe at 20 K (top panel) and at the K-edge of Cd at some selected temperatures (bottom panel). (b) Modulus (continuous lines) and imaginary parts (dotted lines) of the corresponding Fourier transforms given by Abd el All et al. (2012 ▸).
Figure 3Fourier transform and EXAFS signals χ(k) at the L 3-edge of Pt in (a, b) impregnated and (c, d) one-pot 2.5 wt% Pt/CeO2 catalysts during in situ reduction and CO oxidation at three different temperatures (323, 373 and 423 K). Fourier transformation of the k 3-weighted EXAFS function k 3χ(k) into R space using a Kaiser–Bessel window function was performed in the range 2–10 Å−1, yielding the function |χ(R)| (Å−4).
Figure 4(a) Optical image and XRF RGB-map (red: Fe; green: Mn; blue: Ni) of a weathered peridotite from the New Caledonia ophiolite. Fe (b) and Ni (c) K-edge XANES of different regions of the rock, highlighting the presence of different types of minerals with contrasted redox states for iron, and variable amounts of nickel.