| Literature DB >> 26481557 |
Y F Wang1,2, Shashi B Singh1,3, Mukta V Limaye1,3, Y C Shao1, S H Hsieh1, L Y Chen1, H C Hsueh1, H T Wang4, J W Chiou5, Y C Yeh6, C W Chen6, C H Chen7, Sekhar C Ray8, J Wang9, W F Pong1, Y Takagi2, T Ohigashi2, T Yokoyama2, N Kosugi2.
Abstract
This investigation studies the various magnetic behaviors ofEntities:
Mesh:
Substances:
Year: 2015 PMID: 26481557 PMCID: PMC4612711 DOI: 10.1038/srep15439
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Field Emission Scanning Electron Microscopy images of (a) GO, (b) M-rGO and (c) H-rGO. Transmission Electron Microscopy images of (d) GO, (e) M-rGO and (f) H-rGO. (g) Raman spectra of GO, M-rGO and H-rGO; inset magnifies Raman spectrum of H-rGO. (h) PL spectra of GO, M-rGO and H-rGO. (i) Room-temperature [M(H)/M(1T)]-H curves of GO, M-rGO and H-rGO after subtraction of diamagnetic background that arises from silicon substrate. Inset in Fig. (i) plots M-H curves (without background subtraction) of GO, M-rGO and H-rGO.
Figure 2OD images and corresponding stack mapping from STXM images of GO, M-rGO and H-rGO are shown in panels I and II.
Panels III-VI present stack mappings from C K-edge STXM images of GO, M-rGO and H-rGO, which are decomposed into blue, yellow, red and green regions that are associated with the different thicknesses of samples. Spectra of all samples typically present background (blue), flat (yellow), medium (red) and wrinkle (green) regions.
Figure 3(a,b) present C K-edge STXM-XANES spectra of GO, M-rGO and H-rGO at flat and wrinkle region respectively. These are the sums of XANES spectra of yellow and green regions of flat and wrinkle regions in panels IV and VI of Fig. 2. Insets magnify 284–290 eV region of STXM-XANES spectra of flat and wrinkle regions. (c) Shows the VB-PES spectra of GO, M-rGO and H-rGO with HOPG as reference. Inset magnifies the rising edges of VB-PES spectra. Lower panel displays difference between VB-PES of M-rGO and H-rGO and that of GO.
Figure 4(a,b) C and O K-edge shows XANES spectra of GO with photo-helicity of incident X-rays parallel (μ+) and anti-parallel (μ−) to direction of magnetization, respectively. Inset magnifies π-σ (σ) region of C (O) K-edge XANES spectra with incident X-rays μ+ and μ− to direction of magnetization. Bottom panels present C and O K-edge XMCD spectra of GO.
Figure 5The local (a) symmetric structure and (b) J-T defect structure around a single vacancy in graphene with corresponding spin-density projections are shown. Local distortions and corresponding C-C distances (in Å) of carbon triangles that surround vacancy centers are highlighted. Spin-polarized electronic band structures of (c) symmetric and (d) J-T defect structures are also illustrated. Majority and minority spins are indicated by blue and red curves, respectively. Band structures of pristine graphene are denoted as black curves for reference. Fermi level (EF), indicated as a dashed line, is set to 0 eV for alignment.
Figure 6Total DOS, spin-polarized PDOS, and spin density of (a) symmetric and (b) J-T defect structures. Contributions from π and σ electrons in defect structures are represented in blue and red curves, respectively. Data for pristine graphene are also included for reference. Fermi level (EF) is set to 0 eV for alignment.