| Literature DB >> 26441577 |
Cheng-Hua Bai1, Emma K Bridger2, Hubert D Zimmer3, Axel Mecklinger1.
Abstract
The enhanced memory performance for items that are tested as compared to being restudied (the testing effect) is a frequently reported memory phenomenon. According to the episodic context account of the testing effect, this beneficial effect of testing is related to a process which reinstates the previously learnt episodic information. Few studies have explored the neural correlates of this effect at the time point when testing takes place, however. In this study, we utilized the ERP correlates of successful memory encoding to address this issue, hypothesizing that if the benefit of testing is due to retrieval-related processes at test then subsequent memory effects (SMEs) should resemble the ERP correlates of retrieval-based processing in their temporal and spatial characteristics. Participants were asked to learn Swahili-German word pairs before items were presented in either a testing or a restudy condition. Memory performance was assessed immediately and 1-day later with a cued recall task. Successfully recalling items at test increased the likelihood that items were remembered over time compared to items which were only restudied. An ERP subsequent memory contrast (later remembered vs. later forgotten tested items), which reflects the engagement of processes that ensure items are recallable the next day were topographically comparable with the ERP correlate of immediate recollection (immediately remembered vs. immediately forgotten tested items). This result shows that the processes which allow items to be more memorable over time share qualitatively similar neural correlates with the processes that relate to successful retrieval at test. This finding supports the notion that testing is more beneficial than restudying on memory performance over time because of its engagement of retrieval processes, such as the re-encoding of actively retrieved memory representations.Entities:
Keywords: ERP; episodic memory; memory retrieval; reinstatement; testing effect
Year: 2015 PMID: 26441577 PMCID: PMC4584999 DOI: 10.3389/fnbeh.2015.00248
Source DB: PubMed Journal: Front Behav Neurosci ISSN: 1662-5153 Impact factor: 3.558
Condition labels categorized by experimental conditions and Memory Condition at three time points.
| Restudy | R | R | SR | |
| R | F | SF | ||
| Testing | R | R | R | RR |
| R | R | F | RF | |
| F | F | F | FF |
R, Remember; F, Forgotten; S, restudy.
Figure 1(A) Illustration of the procedure realized in each session. (B) Procedure for one cycle on Day 1. Five such cycles each consisting of 22 different items were run on Day 1. The procedure of the final cued recall test on Day 2 was identical to Day 1 recall except for a longer response deadline to 6000 ms and the testing of all 110 items, which is not illustrated in this figure. Note that in Phase 2 (the EEG session) participants did not respond before the offset of the restudy or testing cues which were presented for 2000 ms, respectively.
Figure 2Percent correct for tested and restudied items at cued recall on Day 1 and at final recall on Day 2. Error bars show 1 ± standard error mean.
Figure 3(A) The ERP waveforms to restudied items which were later remember and forgotten (SR/SF) were not significantly different at any time windows of interest. (B) ERP waveforms to all restudied items (RS) and tested items categories by Memory Condition (RR, RF, FF). ERPs are plotted from 100 ms before stimulus onset to 1000 ms thereafter at frontal, central and posterior midline sites: Fz, Cz, and Pz. Three time windows of interest are marked in gray. The waveforms were low-passed filtered at 12 Hz for illustration. RR, remembered; RF, later forgotten; FF, immediately forgotten.
ANOVA table for (A) Restudy SME, Test SME, and Immediate retrieval effect (B) LPN analyses.
| (i) | (iv) | ||||||
| Restudy subsequent memory effect | LPN | ||||||
| SR/SF | Condition | n.s. | n.s. | n.s. | RS/RR | Condition | n.s. |
| … × AP | n.s. | n.s. | n.s. | … × AP | |||
| … × LAT | n.s. | n.s. | n.s. | … × LAT | n.s. | ||
| … × AP × LAT | n.s. | n.s. | n.s. | … × AP × LAT | n.s. | ||
| (ii) | RS/RF | Condition | n.s. | ||||
| Test subsequent memory effect | … × AP | n.s. | |||||
| RR/RF | Condition | … × LAT | n.s. | ||||
| … × AP | n.s. | n.s. | n.s. | … × AP × LAT | n.s. | ||
| … × LAT | n.s. | n.s. | n.s. | RS/FF | Condition | ||
| … × AP × LAT | n.s. | n.s. | n.s. | … × AP | n.s. | ||
| (iii) | … × LAT | n.s. | |||||
| Immediate retrieval effect | … × AP × LAT | n.s. | |||||
| RF/FF | Condition | n.s. | n.s. | RR/FF | Condition | ||
| … × AP | n.s. | n.s. | … × AP | ||||
| … × LAT | n.s. | n.s. | n.s. | … × LAT | |||
| … × AP × LAT | n.s. | n.s. | n.s. | … × AP × LAT | |||
Degrees of freedom, F- and p- values are listed only for significant results (p < 0.05). Anterior-posterior (AP), laterality (LAT). SR, studied remembered; SF, studied forgotten; RR, remembered; RF, later forgotten; FF, immediately forgotten. Non-significant is abbreviated as n.s. Shading indicates significant outcomes.
Figure 4Topographical maps showing the scalp distributions of the subsequent memory effect (RR-RF) and the immediate retrieval effect (RF-FF). The subsequent memory effect started at an earlier time window (300–500 ms). Both effects show similar scalp topography in the 500–700 ms time window. The voltage scale is from 0 to 3 μV for the subsequent memory condition and from 0 to 4 μV for the immediate retrieval condition.