Literature DB >> 26441334

Temperature Calibration for In Situ Environmental Transmission Electron Microscopy Experiments.

Jonathan P Winterstein1, Pin Ann Lin2, Renu Sharma2.   

Abstract

In situ environmental transmission electron microscopy (ETEM) experiments require specimen heating holders to study material behavior in gaseous environments at elevated temperatures. In order to extract meaningful kinetic parameters, such as activation energies, it is essential to have a direct and accurate measurement of local sample temperature. This is particularly important if the sample temperature might fluctuate, for example when room temperature gases are introduced to the sample area. Using selected-area diffraction (SAD) in an ETEM, the lattice parameter of Ag nanoparticles was measured as a function of the temperature and pressure of hydrogen gas to provide a calibration of the local sample temperature. SAD permits measurement of temperature to an accuracy of ±30°C using Ag lattice expansion. Gas introduction can cause sample cooling of several hundred degrees celsius for gas pressures achievable in the ETEM.

Entities:  

Keywords:  zzm321990 in situzzm321990 ; environmental TEM; selected-area diffraction; temperature measurement

Year:  2015        PMID: 26441334      PMCID: PMC4712447          DOI: 10.1017/S1431927615015196

Source DB:  PubMed          Journal:  Microsc Microanal        ISSN: 1431-9276            Impact factor:   4.127


  10 in total

1.  Using the Hough transform for HOLZ line identification in convergent beam electron diffraction.

Authors: 
Journal:  J Microsc       Date:  1999-04       Impact factor: 1.758

2.  Design and Applications of Environmental Cell Transmission Electron Microscope for In Situ Observations of Gas-Solid Reactions.

Authors:  Renu Sharma
Journal:  Microsc Microanal       Date:  2001-11       Impact factor: 4.127

3.  In situ ultra-high vacuum transmission electron microscopy studies of the transient oxidation stage of Cu and Cu alloy thin films.

Authors:  Judith C Yang; Guangwen Zhou
Journal:  Micron       Date:  2012-03-17       Impact factor: 2.251

4.  Circular Hough transform diffraction analysis: a software tool for automated measurement of selected area electron diffraction patterns within Digital Micrograph.

Authors:  D R G Mitchell
Journal:  Ultramicroscopy       Date:  2007-06-23       Impact factor: 2.689

5.  Electron thermal microscopy.

Authors:  Todd Brintlinger; Yi Qi; Kamal H Baloch; David Goldhaber-Gordon; John Cumings
Journal:  Nano Lett       Date:  2008-01-30       Impact factor: 11.189

6.  A new MEMS-based system for ultra-high-resolution imaging at elevated temperatures.

Authors:  Lawrence F Allard; Wilbur C Bigelow; Miguel Jose-Yacaman; David P Nackashi; John Damiano; Stephen E Mick
Journal:  Microsc Res Tech       Date:  2009-03       Impact factor: 2.769

7.  Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopy.

Authors:  S B Vendelbo; P J Kooyman; J F Creemer; B Morana; L Mele; P Dona; B J Nelissen; S Helveg
Journal:  Ultramicroscopy       Date:  2013-04-28       Impact factor: 2.689

8.  In Situ Studies of the Interaction of Dislocations with Point Defects during Annealing of Ion Implanted Si/SiGe/Si (001) Heterostructures.

Authors: 
Journal:  Microsc Microanal       Date:  1998-05       Impact factor: 4.127

9.  Applications of Ion Microscopy and In Situ Electron Microscopy to the Study of Electronic Materials and Devices.

Authors: 
Journal:  Microsc Microanal       Date:  1998-05       Impact factor: 4.127

10.  Vibrational and optical spectroscopies integrated with environmental transmission electron microscopy.

Authors:  Matthieu Picher; Stefano Mazzucco; Steve Blankenship; Renu Sharma
Journal:  Ultramicroscopy       Date:  2014-12-02       Impact factor: 2.689

  10 in total
  1 in total

Review 1.  Current status and future directions for in situ transmission electron microscopy.

Authors:  Mitra L Taheri; Eric A Stach; Ilke Arslan; P A Crozier; Bernd C Kabius; Thomas LaGrange; Andrew M Minor; Seiji Takeda; Mihaela Tanase; Jakob B Wagner; Renu Sharma
Journal:  Ultramicroscopy       Date:  2016-08-06       Impact factor: 2.689

  1 in total

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