| Literature DB >> 26435685 |
Christopher A R Chapman1, Pallavi Daggumati2, Shannon C Gott3, Masaru P Rao4, Erkin Seker2.
Abstract
This paper illustrates the effect of substrate topography on morphology evolution in nanoporous gold (np-Au) thin films. One micron-high silicon ridges with widths varying between 150 nm to 50 µm were fabricated and coated with 500 nm-thick np-Au films obtained by dealloying sputtered gold-silver alloy films. Analysis of scanning electron micrographs of the np-Au films following dealloying and thermal annealing revealed two distinct regimes where the ratio of film thickness to ridge width determines the morphological evolution of np-Au films.Entities:
Keywords: annealing; dealloying; fracture; microfabrication; nanoporous material
Year: 2016 PMID: 26435685 PMCID: PMC4587536 DOI: 10.1016/j.scriptamat.2015.07.039
Source DB: PubMed Journal: Scr Mater ISSN: 1359-6462 Impact factor: 5.611