Literature DB >> 26412944

Active Damping of a Piezoelectric Tube Scanner using Self-Sensing Piezo Actuation.

S Kuiper1, G Schitter2.   

Abstract

In most Atomic Force Microscopes (AFM), a piezoelectric tube scanner is used to position the sample underneath the measurement probe. Oscillations stemming from the weakly damped resonances of the tube scanner are a major source of image distortion, putting a limitation on the achievable imaging speed. This paper demonstrates active damping of these oscillations in multiple scanning axes without the need for additional position sensors. By connecting the tube scanner in a capacitive bridge circuit the scanner oscillations can be measured in both scanning axes, using the same piezo material as an actuator and sensor simultaneously. In order to compensate for circuit imbalance caused by hysteresis in the piezo element, an adaptive balancing circuit is used. The obtained measurement signal is used for feedback control, reducing the resonance peaks in both scanning axes by 18 dB and the cross-coupling at those frequencies by 30 dB. Experimental results demonstrate a significant reduction in scanner oscillations when applying the typical triangular scanning signals, as well as a strong reduction in coupling induced oscillations. Recorded AFM images show a considerable reduction in image distortion due to the proposed control method, enabling artifact free AFM imaging at a speed of 122 lines per second with a standard piezoelectric tube scanner.

Entities:  

Keywords:  Atomic Force Microscopy; Piezoelectric actuators; self-sensing actuation

Year:  2010        PMID: 26412944      PMCID: PMC4583213          DOI: 10.1016/j.mechatronics.2010.07.003

Source DB:  PubMed          Journal:  Mechatronics (Oxf)        ISSN: 0957-4158            Impact factor:   3.498


  4 in total

1.  A high-speed atomic force microscope for studying biological macromolecules.

Authors:  T Ando; N Kodera; E Takai; D Maruyama; K Saito; A Toda
Journal:  Proc Natl Acad Sci U S A       Date:  2001-10-09       Impact factor: 11.205

2.  Atomic force microscope.

Authors: 
Journal:  Phys Rev Lett       Date:  1986-03-03       Impact factor: 9.161

3.  Applied physics. High-speed atomic force microscopy.

Authors:  Paul K Hansma; Georg Schitter; Georg E Fantner; Craig Prater
Journal:  Science       Date:  2006-10-27       Impact factor: 47.728

4.  Simultaneous sensing and actuation with a piezoelectric tube scanner.

Authors:  S O Reza Moheimani; Yuen K Yong
Journal:  Rev Sci Instrum       Date:  2008-07       Impact factor: 1.523

  4 in total

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