| Literature DB >> 26250695 |
Javid Fatullayev1, Mostafa Samak2, Anton Sabashnikov1, Mohamed Zeriouh1, Parwis B Rahmanian3, Yeong-Hoon Choi3, Bastian Schmack4, Klaus Kallenbach4, Arjang Ruhparwar4, Kaveh Eghbalzadeh3, Pascal M Dohmen5, Matthias Karck4, Jens Wippermann3, Thorsten Wahlers3, Aron-Frederik Popov1, Andre R Simon1, Alexander Weymann1.
Abstract
Left ventricular assist devices (LVAD) are an increasingly implemented therapeutic intervention for patients with end-stage heart failure. A growing body of evidence, however, has shown an elevated risk of device thrombosis, a major complication jeopardizing the patient's post-implantation survival. To date, multiple causative factors for LVAD thrombosis have been identified, such as internal shear stress, device material, infection, and inadequate anticoagulation. Understanding the mechanisms leading to LVAD thrombosis will not only enable device optimization, but also allow for better patient handling, hence improving post-implantation outcome. In this review we highlight the most commonly identified factors leading to LVAD thrombosis and discuss their mechanisms.Entities:
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Year: 2015 PMID: 26250695 PMCID: PMC4500598 DOI: 10.12659/MSMBR.894840
Source DB: PubMed Journal: Med Sci Monit Basic Res ISSN: 2325-4394
Figure 1The HVAD® Pump (HeartWare International, Inc., MA, USA). A third-generation, miniaturized, continuous-flow ventricular assist device.
Figure 2Intraoperative picture showing the precisely positioned inflow cannula of the HVAD® Pump (HeartWare International, Inc., MA, USA) in the left ventricular apex during explantation of the device for transplant.
Figure 3Intraoperative image depicting severe pump thrombosis of a patient with inadequate anticoagulation regime.