| Literature DB >> 26206731 |
M E Yahia1, R E Tolba2, N A El-Bedwehy2, S K El-Labany3, W M Moslem4.
Abstract
A new approach to understand the electron/hole interfaced plasma in GaN high electron mobility transistors (HEMTs). A quantum hydrodynamic model is constructed to include electrons/holes degenerate pressure, Bohm potential, and the exchange/correlation effect and then reduced to the nonlinear Schrödinger equation (NLSE). Numerical analysis of the latter predicts the rough (in)stability domains, which allow for the rogue waves to occur. Our results might give physical solution rather than the engineering one to the intrinsic problems in these high frequency/power transistors.Entities:
Year: 2015 PMID: 26206731 PMCID: PMC4513275 DOI: 10.1038/srep12245
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1The ratio P/Q contour is depicted against the wave number k and electron number density n; the yellow (white) color represents the region where the unstable (stable) waves set in.
(a) and (b) with all quantum effects and (c) without Bohm potential effect.
Figure 2Maximum rogue wave amplitude |φ| contour is depicted against the wave number k and electron number density n for different regions of k.
Light-colored regions correspond to high values of |φ|.
Figure 3The rogue wave profile for carrier density n = 1025 m−3 and k = 15.