| Literature DB >> 26134814 |
Rajmund Mokso1, Peter Oberta2.
Abstract
Dual-energy or K-edge imaging is used to enhance contrast between two or more materials in an object and is routinely realised by acquiring two separate X-ray images each at different X-ray wavelength. On a broadband synchrotron source an imaging system to acquire the two images simultaneously was realised. The single-shot approach allows dual-energy and stereo imaging to be applied to dynamic systems. Using a Laue-Bragg crystal splitting scheme, the X-ray beam was split into two and the two beam branches could be easily tuned to either the same or to two different wavelengths. Due to the crystals' mutual position, the two beam branches intercept each other under a non-zero angle and create a stereoscopic setup.Entities:
Keywords: crystals; dual-energy; imaging; optics
Year: 2015 PMID: 26134814 PMCID: PMC4787031 DOI: 10.1107/S1600577515006554
Source DB: PubMed Journal: J Synchrotron Radiat ISSN: 0909-0495 Impact factor: 2.616
Figure 1Schematic and experimental crystal setup realised at the TOMCAT beamline. The monochromatic impinging beam is split on the Laue crystal (LC). The two beam branches are diffracted further downstream by the two Bragg crystals (BC1, BC2) before they cross again in the sample plane. The spatially separated images after one and two diffractions are collected at two detector positions (D1 and D2, respectively).
Figure 2The diffracted beam after the Laue Si crystal and consequently by the Si Bragg crystal (BC1) (left image), and the beam transmitted through the Laue crystal and diffracted by the Si Bragg crystal (BC2) (right image). For the purpose of this visualization the image intensities were normalized. One can see the stripe structure of the multilayer monochromator. The perpendicular lines to the stripes are scratches from the surface processing. Other artefacts are dust on the scintillator.
Figure 3The test sample consisting of a 20 µm Zr foil and a standard copper TEM grid type 400 is placed between the BC2 crystal and the detector.
Figure 4(Left) Image of the Zr mesh below the K1 absorption edge, (middle) image of the Zr mesh with one half of the image below and the other half above the K1 absorption edge and (right) image of the Zr mesh above the K1 absorption edge. A normalized mean intensity profile in the horizontal direction across the whole image is shown in the lower part of the middle image. The normalized intensity profiles shown on the lower left and right plots are captured along the white line at the upper right border of the grid. The length of the profile plots is 120 pixels corresponding to 780 µm to show the contrast in the grating with the hole size of 45 µm. All images are acquired using the same detector configuration with pixel size of 6.5 µm.