| Literature DB >> 25977845 |
Alexander G Milekhin1, Nikolay A Yeryukov1, Larisa L Sveshnikova2, Tatyana A Duda2, Ekaterina E Rodyakina1, Victor A Gridchin3, Evgeniya S Sheremet4, Dietrich R T Zahn4.
Abstract
We present the results of a Raman study of optical phonons in CuS nanocrystals (NCs) with a low areal density fabricated through the Langmuir-Blodgett technology on nanopatterned Au nanocluster arrays using a combination of surface- and interference-enhanced Raman scattering (SERS and IERS, respectively). Micro-Raman spectra of one monolayer of CuS NCs deposited on a bare Si substrate reveal only features corresponding to crystalline Si. However, a new relatively strong peak occurs in the Raman spectrum of CuS NCs on Au nanocluster arrays at 474 cm(-1). This feature is related to the optical phonon mode in CuS NCs and manifests the SERS effect. For CuS NCs deposited on a SiO2 layer this phonon mode is also observed due to the IERS effect. Its intensity changes periodically with increasing SiO2 layer thickness for different laser excitation lines and is enhanced by a factor of about 30. CuS NCs formed on Au nanocluster arrays fabricated on IERS substrates combine the advantages of SERS and IERS and demonstrate stronger SERS enhancement allowing for the observation of Raman signals from CuS NCs with an ultra-low areal density.Entities:
Keywords: copper sulfide (CuS) nanocrystals; interference-enhanced Raman spectroscopy; phonons; surface-enhanced Raman spectroscopy
Year: 2015 PMID: 25977845 PMCID: PMC4419689 DOI: 10.3762/bjnano.6.77
Source DB: PubMed Journal: Beilstein J Nanotechnol ISSN: 2190-4286 Impact factor: 3.649
Figure 1A typical Raman spectrum of the dense ensemble of CuS NCs (about 5–6 MLs) on a Au substrate excited with 514.5 nm.
Figure 2Raman spectra of CuS NCs (of about 1 ML coverage) fabricated on a Si substrate with a SiO2 layer of variable thickness. Raman spectra were taken using 514.5 nm excitation wavelength.
Figure 3The dependence of the IERS enhancement factor of phonon modes in CuS NCs on the thickness of the SiO2 layer determined for laser excitation lines at 632.8, 514.5, and 325 nm.
Figure 4a) SEM image and b) micro-Raman spectra of CuS NCs deposited on Si (lower part) and Au nanocluster array (upper part).
Figure 5Raman spectra of CuS NCs deposited on bare Si, 75 nm SiO2 layer on Si, and on Au arrays fabricated on Si and SiO2 layer on Si measured with 632.8 nm.
Figure 6a) SEM image of CuS NCs with an ultra-low areal density deposited on Au arrays on SiO2 layer and b) SERS-IERS Raman spectra measured with 632.8 nm. SERS spectrum of CuS NCs with 1 ML coverage on Au arrays formed on SiO2 layer (curve 1) together with the Raman response of the CuS NCs of ultra-low areal density (denoted as 0.1 ML, curve 2). The 25 times enlarged fragment of curve 2 is shown for comparison.