| Literature DB >> 25775044 |
Kevin Smith1, Yunpeng Li2, Filippo Piccinini3, Gabor Csucs1, Csaba Balazs1, Alessandro Bevilacqua4, Peter Horvath5.
Abstract
Uneven illumination affects every image acquired by a microscope. It is often overlooked, but it can introduce considerable bias to image measurements. The most reliable correction methods require special reference images, and retrospective alternatives do not fully model the correction process. Our approach overcomes these issues for most optical microscopy applications without the need for reference images.Mesh:
Year: 2015 PMID: 25775044 DOI: 10.1038/nmeth.3323
Source DB: PubMed Journal: Nat Methods ISSN: 1548-7091 Impact factor: 28.547