| Literature DB >> 25364299 |
Robert Sinclair1, Paul Joseph Kempen2, Richard Chin3, Ai Leen Koh4.
Abstract
This article describes the establishment, over a period of ten years or so, of a multi-user, institution-wide facility for the characterization of materials and devices at the nano-scale. Emphasis is placed on the type of equipment that we have found to be most useful for our users, and the business strategy that maintains its operations. A central component of our facility is an aberration-corrected environmental transmission electron microscope and its application is summarized in the studies of plasmon energies of silver nanoparticles, the band gap of PbS quantum dots, atomic site occupancy near grain boundaries in yttria stabilized zirconia, the lithiation of silicon nanoparticles, in situ observations on carbon nanotube oxidation and the electron tomography of varicella zoster virus nucleocapsids.Entities:
Year: 2014 PMID: 25364299 PMCID: PMC4215512 DOI: 10.1002/adem.201400015
Source DB: PubMed Journal: Adv Eng Mater ISSN: 1438-1656 Impact factor: 3.862