| Literature DB >> 25299161 |
Michael Engel1, Mathias Steiner, Phaedon Avouris.
Abstract
Black phosphorus is a layered semiconductor that is intensely researched in view of applications in optoelectronics. In this letter, we investigate a multilayer black phosphorus photodetector that is capable of acquiring high-contrast (V > 0.9) images both in the visible (λVIS = 532 nm) as well as in the infrared (λIR = 1550 nm) spectral regime. In a first step, by using photocurrent microscopy, we map the active area of the device and we characterize responsivity and gain. In a second step, by deploying the black phosphorus device as a point-like detector in a confocal microsope setup, we acquire diffraction-limited optical images with submicron resolution. The results demonstrate the usefulness of black phosphorus as an optoelectronic material for hyperspectral imaging applications.Entities:
Keywords: Black phosphorus; imaging; near-infrared; optoelectronics; photodetector
Year: 2014 PMID: 25299161 DOI: 10.1021/nl502928y
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189