| Literature DB >> 25162680 |
Tong Zhou1, Cunyi Gao2, Linlin Du1, Hui Feng1, Lijiao Wang1, Ying Lan1, Feng Sun1, Lihui Wei1, Yongjian Fan1, Wenbiao Shen3, Yijun Zhou1.
Abstract
The inheritance of resistance to white tip disease (WTDR) in rice (Oryza sativa L.) was analyzed with an artificial inoculation test in a segregating population derived from the cross between Tetep, a highly resistant variety that was identified in a previous study, and a susceptible cultivar. Three resistance-associated traits, including the number of Aphelenchoides besseyi (A. besseyi) individuals in 100 grains (NA), the loss rate of panicle weight (LRPW) and the loss rate of the total grains per panicle (LRGPP) were analyzed for the detection of the quantitative trait locus (QTL) in the population after construction of a genetic map. Six QTLs distributed on chromosomes 3, 5 and 9 were mapped. qNA3 and qNA9, conferring reproduction number of A. besseyi in the panicle, accounted for 16.91% and 12.54% of the total phenotypic variance, respectively. qDRPW5a and qDRPW5b, associated with yield loss, were located at two adjacent marker intervals on chromosome 5 and explained 14.15% and 14.59% of the total phenotypic variation and possessed LOD values of 3.40 and 3.39, respectively. qDRPW9 was considered as a minor QTL and only explained 1.02% of the phenotypic variation. qLRGPP5 contributed to the loss in the number of grains and explained 10.91% of the phenotypic variation. This study provides useful information for the breeding of resistant cultivars against white tip disease in rice.Entities:
Mesh:
Year: 2014 PMID: 25162680 PMCID: PMC4146579 DOI: 10.1371/journal.pone.0106099
Source DB: PubMed Journal: PLoS One ISSN: 1932-6203 Impact factor: 3.240
Three performance traits of the two parents and the F2∶3 lines.
| Traits | Huaidao No.5 | Tetep | |P1–P2| | F2∶3 lines | |
| Mean±SD | Range | ||||
| NA | 472±80 | 51±19 | 421 | 222±110 | 24–514 |
| LRPW | 0.28±0.19 | 0.04±0.01 | 0.24 | 0.15±0.10 | 0.01–0.44 |
| LRGPP | 0.29±0.09 | 0.05±0.01 | 0.24 | 0.22±0.13 | 0.00–0.64 |
P1 and P2 represent Huaidao No.5 and Tetep, respectively.
Figure 1The frequency distributions of three resistance-associated traits in the F2∶3 lines.
P1 represents Huaidao No.5, P2 represents Tetep, and M represents the mean value of the F2∶3 lines.
Correlation coefficients among the three resistance-associated traits.
| Traits | NA | LRPW | LRGPP |
| NA | 1 | ||
| LRPW | 0.022 | 1 | |
| LRGPP | −0.059 | 0.424 | 1 |
**Significant at the 0.01 level.
QTLs for resistance to WTDR detected in the F2 lines developed from crossing Huaidao No.5 and Tetep.
| Traits | QTL | Chr. | Interval | R2 (%) | A (%) | LOD |
| NA |
| 3 | RM5626-RM7097 | 16.91 | 71.18 | 3.04 |
|
| 9 | RM5526-RM3912 | 12.54 | −61.08 | 2.62 | |
| LRPW |
| 5 | RM163-RM18620 | 14.15 | 5.43 | 3.40 |
|
| 5 | RM440-RM161 | 14.59 | 5.51 | 3.39 | |
|
| 9 | RM5526-RM3912 | 1.02 | −1.5 | 2.55 | |
| LRGPP |
| 5 | RM18632-RM163 | 10.91 | 1.94 | 2.83 |
QTL represents the putative QTL at an LOD level ≥2.5.
Chr. represents Chromosome.
R2 represents the phenotypic variance of each QTL.
A is an additive effect.
Figure 2The SSR linkage map and chromosomal distributions of the putative loci responsible for resistance to WTDR.
▪, ⧫ and • indicate the resistance QTLs detected using the resistance-associated traits of NA, LRPW and LRGPP, respectively.