Literature DB >> 24876431

Use of the DISST model to estimate the HOMA and Matsuda indexes using only a basal insulin assay.

Shaun M Davidson1, Paul D Docherty2, J Geoffrey Chase2.   

Abstract

It is hypothesized that early detection of reduced insulin sensitivity (SI) could prompt intervention that may reduce the considerable financial strain type 2 diabetes mellitus (T2DM) places on global health care. Reduction of the cost of already inexpensive SI metrics such as the Matsuda and HOMA indexes would enable more widespread, economically feasible use of these metrics for screening. The goal of this research was to determine a means of reducing the number of insulin samples and therefore the cost required to provide an accurate Matsuda Index value. The Dynamic Insulin Sensitivity and Secretion Test (DISST) model was used with the glucose and basal insulin measurements from an Oral Glucose Tolerance Test (OGTT) to predict patient insulin responses. The insulin response to the OGTT was determined via population based regression analysis that incorporated the 60-minute glucose and basal insulin values. The proposed method derived accurate and precise Matsuda Indices as compared to the fully sampled Matsuda (R = .95) using only the basal assay insulin-level data and 4 glucose measurements. Using a model employing the basal insulin also allows for determination of the 1-day HOMA value. The DISST model was successfully modified to allow for the accurate prediction an individual's insulin response to the OGTT. In turn, this enabled highly accurate and precise estimation of a Matsuda Index using only the glucose and basal insulin assays. As insulin assays account for the majority of the cost of the Matsuda Index, this model offers a significant reduction in assay cost.
© 2014 Diabetes Technology Society.

Entities:  

Keywords:  DISST; HOMA; Matsuda; OGTT

Mesh:

Substances:

Year:  2014        PMID: 24876431      PMCID: PMC4764219          DOI: 10.1177/1932296814532490

Source DB:  PubMed          Journal:  J Diabetes Sci Technol        ISSN: 1932-2968


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