| Literature DB >> 24766006 |
A Lupascu1, J P Clancy1, H Gretarsson1, Zixin Nie1, J Nichols2, J Terzic2, G Cao2, S S A Seo2, Z Islam3, M H Upton3, Jungho Kim3, D Casa3, T Gog3, A H Said3, Vamshi M Katukuri4, H Stoll5, L Hozoi4, J van den Brink4, Young-June Kim1.
Abstract
We report x-ray resonant magnetic scattering and resonant inelastic x-ray scattering studies of epitaxially strained Sr2IrO4 thin films. The films were grown on SrTiO3 and (LaAlO3)0.3(Sr2AlTaO6)0.7 substrates, under slight tensile and compressive strains, respectively. Although the films develop a magnetic structure reminiscent of bulk Sr2IrO4, the magnetic correlations are extremely anisotropic, with in-plane correlation lengths significantly longer than the out-of-plane correlation lengths. In addition, the compressive (tensile) strain serves to suppress (enhance) the magnetic ordering temperature TN, while raising (lowering) the energy of the zone-boundary magnon. Quantum chemical calculations show that the tuning of magnetic energy scales can be understood in terms of strain-induced changes in bond lengths.Entities:
Year: 2014 PMID： 24766006 DOI： 10.1103/PhysRevLett.112.147201
Source DB: PubMed Journal: Phys Rev Lett ISSN： 0031-9007 Impact factor: 9.161