| Literature DB >> 24763647 |
Siwei Wang1, Jesse Ward2, Sven Leyffer1, Stefan M Wild1, Chris Jacobsen2, Stefan Vogt2.
Abstract
A novel approach to locate, identify and refine positions and whole areas of cell structures based on elemental contents measured by X-ray fluorescence microscopy is introduced. It is shown that, by initializing with only a handful of prototypical cell regions, this approach can obtain consistent identification of whole cells, even when cells are overlapping, without training by explicit annotation. It is robust both to different measurements on the same sample and to different initializations. This effort provides a versatile framework to identify targeted cellular structures from datasets too complex for manual analysis, like most X-ray fluorescence microscopy data. Possible future extensions are also discussed.Keywords: X-ray fluorescence microscopy (XFM); cell identification; modeling overlapping cells; trace element distributions; unsupervised object recognition
Year: 2014 PMID: 24763647 DOI: 10.1107/S1600577514001416
Source DB: PubMed Journal: J Synchrotron Radiat ISSN: 0909-0495 Impact factor: 2.616