Literature DB >> 24658806

Quantitative surface analysis of a binary drug mixture--suppression effects in the detection of sputtered ions and post-ionized neutrals.

Gabriel Karras, Nicholas P Lockyer.   

Abstract

A systematic mass spectrometric study of two of the most common analgesic drugs, paracetamol and ibuprofen, is reported. The drugs were studied by means of secondary ion mass spectrometry (SIMS) and secondary neutral mass spectrometry (SNMS) using laser post-ionization (LPI) both in pure samples and in a two-component mixture. Ion suppression within the two-component system observed in SIMS mode is ameliorated using LPI under room temperature analysis. However, suppression effects are apparent in LPI mode on performing the analysis at cryogenic temperatures, which we attribute to changes in the desorption characteristics of sputtered molecules, which influences the subsequent post-ionization efficiency. This suggests different mechanisms of ion suppression in SIMS and LPI modes.

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Year:  2014        PMID: 24658806     DOI: 10.1007/s13361-014-0847-6

Source DB:  PubMed          Journal:  J Am Soc Mass Spectrom        ISSN: 1044-0305            Impact factor:   3.109


  22 in total

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2.  Performance characteristics of a chemical imaging time-of-flight mass spectrometer.

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Journal:  Rapid Commun Mass Spectrom       Date:  1998       Impact factor: 2.419

3.  Sample cooling or rotation improves C60 organic depth profiles of multilayered reference samples: results from a VAMAS interlaboratory study.

Authors:  P Sjövall; D Rading; S Ray; L Yang; A G Shard
Journal:  J Phys Chem B       Date:  2010-01-21       Impact factor: 2.991

4.  Imaging with ion beams and laser postionization.

Authors:  M Wood; Y Zhou; C L Brummel; N Winograd
Journal:  Anal Chem       Date:  1994-08-01       Impact factor: 6.986

5.  Development of an ultra-high performance multi-turn TOF-SIMS/SNMS system "MULTUM-SIMS/SNMS".

Authors:  Shingo Ebata; Morio Ishihara; Kousuke Kumondai; Ryo Mibuka; Kiichiro Uchino; Hisayoshi Yurimoto
Journal:  J Am Soc Mass Spectrom       Date:  2013-01-05       Impact factor: 3.109

6.  Cluster secondary ion mass spectrometry and the temperature dependence of molecular depth profiles.

Authors:  Dan Mao; Andreas Wucher; Daniel A Brenes; Caiyan Lu; Nicholas Winograd
Journal:  Anal Chem       Date:  2012-04-10       Impact factor: 6.986

7.  Proton transfer in time-of-flight secondary ion mass spectrometry studies of frozen-hydrated dipalmitoylphosphatidylcholine.

Authors:  Thomas P Roddy; Donald M Cannon; Sara G Ostrowski; Andrew G Ewing; Nicholas Winograd
Journal:  Anal Chem       Date:  2003-08-15       Impact factor: 6.986

8.  Temperature effects in the sputtering of a molecular solid by energetic atomic and cluster projectiles.

Authors:  D A Brenes; D Willingham; N Winograd; Z Postawa
Journal:  Surf Interface Anal       Date:  2011-01       Impact factor: 1.607

9.  Strong-field Photoionization of Sputtered Neutral Molecules for Molecular Depth Profiling.

Authors:  D Willingham; D A Brenes; A Wucher; N Winograd
Journal:  J Phys Chem C Nanomater Interfaces       Date:  2010-04-01       Impact factor: 4.126

10.  Suppression and enhancement of secondary ion formation due to the chemical environment in static-secondary ion mass spectrometry.

Authors:  Emrys A Jones; Nicholas P Lockyer; Jeanette Kordys; John C Vickerman
Journal:  J Am Soc Mass Spectrom       Date:  2007-05-24       Impact factor: 3.109

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  1 in total

1.  Quantifying SIMS of Organic Mixtures and Depth Profiles-Characterizing Matrix Effects of Fragment Ions.

Authors:  M P Seah; R Havelund; S J Spencer; I S Gilmore
Journal:  J Am Soc Mass Spectrom       Date:  2018-10-23       Impact factor: 3.109

  1 in total

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