Literature DB >> 24524867

A novel low energy electron microscope for DNA sequencing and surface analysis.

M Mankos1, K Shadman2, H H J Persson3, A T N'Diaye4, A K Schmid5, R W Davis3.   

Abstract

Monochromatic, aberration-corrected, dual-beam low energy electron microscopy (MAD-LEEM) is a novel technique that is directed towards imaging nanostructures and surfaces with sub-nanometer resolution. The technique combines a monochromator, a mirror aberration corrector, an energy filter, and dual beam illumination in a single instrument. The monochromator reduces the energy spread of the illuminating electron beam, which significantly improves spectroscopic and spatial resolution. Simulation results predict that the novel aberration corrector design will eliminate the second rank chromatic and third and fifth order spherical aberrations, thereby improving the resolution into the sub-nanometer regime at landing energies as low as one hundred electron-Volts. The energy filter produces a beam that can extract detailed information about the chemical composition and local electronic states of non-periodic objects such as nanoparticles, interfaces, defects, and macromolecules. The dual flood illumination eliminates charging effects that are generated when a conventional LEEM is used to image insulating specimens. A potential application for MAD-LEEM is in DNA sequencing, which requires high resolution to distinguish the individual bases and high speed to reduce the cost. The MAD-LEEM approach images the DNA with low electron impact energies, which provides nucleobase contrast mechanisms without organometallic labels. Furthermore, the micron-size field of view when combined with imaging on the fly provides long read lengths, thereby reducing the demand on assembling the sequence. Experimental results from bulk specimens with immobilized single-base oligonucleotides demonstrate that base specific contrast is available with reflected, photo-emitted, and Auger electrons. Image contrast simulations of model rectangular features mimicking the individual nucleotides in a DNA strand have been developed to translate measurements of contrast on bulk DNA to the detectability of individual DNA bases in a sequence.
Copyright © 2014 Elsevier B.V. All rights reserved.

Entities:  

Keywords:  Aberration correction; Contrast; DNA Sequencing; Dual beam illumination; Energy filtering; Low energy electron microscopy; Monochromator

Mesh:

Substances:

Year:  2014        PMID: 24524867      PMCID: PMC4117835          DOI: 10.1016/j.ultramic.2014.01.007

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  15 in total

1.  Molecular structure of nucleic acids; a structure for deoxyribose nucleic acid.

Authors:  J D WATSON; F H CRICK
Journal:  Nature       Date:  1953-04-25       Impact factor: 49.962

2.  Stretching DNA with a receding meniscus: Experiments and models.

Authors: 
Journal:  Phys Rev Lett       Date:  1995-06-05       Impact factor: 9.161

3.  Double aberration correction in a low-energy electron microscope.

Authors:  Th Schmidt; H Marchetto; P L Lévesque; U Groh; F Maier; D Preikszas; P Hartel; R Spehr; G Lilienkamp; W Engel; R Fink; E Bauer; H Rose; E Umbach; H-J Freund
Journal:  Ultramicroscopy       Date:  2010-07-13       Impact factor: 2.689

4.  A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design.

Authors:  R M Tromp; J B Hannon; A W Ellis; W Wan; A Berghaus; O Schaff
Journal:  Ultramicroscopy       Date:  2010-03-31       Impact factor: 2.689

5.  Nondestructive imaging of individual biomolecules.

Authors:  Matthias Germann; Tatiana Latychevskaia; Conrad Escher; Hans-Werner Fink
Journal:  Phys Rev Lett       Date:  2010-03-02       Impact factor: 9.161

6.  High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy.

Authors:  Ondrej L Krivanek; Jonathan P Ursin; Neil J Bacon; George J Corbin; Niklas Dellby; Petr Hrncirik; Matthew F Murfitt; Christopher S Own; Zoltan S Szilagyi
Journal:  Philos Trans A Math Phys Eng Sci       Date:  2009-09-28       Impact factor: 4.226

7.  Trends in low energy electron microscopy.

Authors:  M S Altman
Journal:  J Phys Condens Matter       Date:  2010-03-05       Impact factor: 2.333

8.  Transmission electron microscopy at 20 kV for imaging and spectroscopy.

Authors:  U Kaiser; J Biskupek; J C Meyer; J Leschner; L Lechner; H Rose; M Stöger-Pollach; A N Khlobystov; P Hartel; H Müller; M Haider; S Eyhusen; G Benner
Journal:  Ultramicroscopy       Date:  2011-04-01       Impact factor: 2.689

9.  DNA base identification by electron microscopy.

Authors:  David C Bell; W Kelley Thomas; Katelyn M Murtagh; Cheryl A Dionne; Adam C Graham; Jobriah E Anderson; William R Glover
Journal:  Microsc Microanal       Date:  2012-10-09       Impact factor: 4.127

10.  A monochromatic, aberration-corrected, dual-beam low energy electron microscope.

Authors:  Marian Mankos; Khashayar Shadman
Journal:  Ultramicroscopy       Date:  2013-03-21       Impact factor: 2.689

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  2 in total

Review 1.  Coming of age: ten years of next-generation sequencing technologies.

Authors:  Sara Goodwin; John D McPherson; W Richard McCombie
Journal:  Nat Rev Genet       Date:  2016-05-17       Impact factor: 53.242

2.  Nucleotide-Specific Contrast for DNA Sequencing by Electron Spectroscopy.

Authors:  Marian Mankos; Henrik H J Persson; Alpha T N'Diaye; Khashayar Shadman; Andreas K Schmid; Ronald W Davis
Journal:  PLoS One       Date:  2016-05-05       Impact factor: 3.240

  2 in total

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