RFLP analysis of an Aegilops ventricosa chromosome that carries a gene conferring resistance to leaf rust (Puccinia recondita) when transferred to hexaploid wheat.

RFLP analysis has been used to characterise XM(v), a chromosome of Aegilops ventricosa present in a disomic addition line of wheat. This chromosome is known to carry a major gene conferring resistance to leaf rust (Lr). The analysis demonstrated that XM(v) is translocated with respect to the standard wheat genome, and consists of a segment of the short arm of homoeologous group 2 attached to a group 6 chromosome lacking a distal part of the short arm. Lr was located to the region of XM(v) with homoeology to 2S by analysis of a leaf rust-susceptible deletion line that was found to lack the entire 2S segment. Confirmation and refinement of the location of Lr was obtained by analysis of a spontaneous resistant translocation in which a small part of XM(v) had been transferred to wheat chromosome 2A.