| Literature DB >> 23889417 |
S K Rhode1, M K Horton, M J Kappers, S Zhang, C J Humphreys, R O Dusane, S -L Sahonta, M A Moram.
Abstract
Aberration-corrected scanning transmission electron microscopy was used to investigate the core structures of threading dislocations in undoped GaN films with both high and low dislocation densities, and in a comparable high dislocation density Mg-doped GaN film. All a-type dislocations in all samples have a 5/7-atom core structure. In contrast, most (a+c)-type dislocations in undoped GaN dissociate due to local strain variations from nearby dislocations. In contrast, Mg doping prevents (a+c)-type dislocation dissociation. Our data indicate that Mg affects dislocation cores in GaN significantly.Entities:
Year: 2013 PMID: 23889417 DOI: 10.1103/PhysRevLett.111.025502
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161