Literature DB >> 23834932

Compressed sensing electron tomography.

Rowan Leary1, Zineb Saghi, Paul A Midgley, Daniel J Holland.   

Abstract

The recent mathematical concept of compressed sensing (CS) asserts that a small number of well-chosen measurements can suffice to reconstruct signals that are amenable to sparse or compressible representation. In addition to powerful theoretical results, the principles of CS are being exploited increasingly across a range of experiments to yield substantial performance gains relative to conventional approaches. In this work we describe the application of CS to electron tomography (ET) reconstruction and demonstrate the efficacy of CS-ET with several example studies. Artefacts present in conventional ET reconstructions such as streaking, blurring of object boundaries and elongation are markedly reduced, and robust reconstruction is shown to be possible from far fewer projections than are normally used. The CS-ET approach enables more reliable quantitative analysis of the reconstructions as well as novel 3D studies from extremely limited data.
Copyright © 2013 Elsevier B.V. All rights reserved.

Entities:  

Keywords:  3D image reconstruction; Compressed sensing; Compressive sampling; Electron tomography; Sparsity

Year:  2013        PMID: 23834932     DOI: 10.1016/j.ultramic.2013.03.019

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  31 in total

1.  Three-dimensional imaging of localized surface plasmon resonances of metal nanoparticles.

Authors:  Olivia Nicoletti; Francisco de la Peña; Rowan K Leary; Daniel J Holland; Caterina Ducati; Paul A Midgley
Journal:  Nature       Date:  2013-10-03       Impact factor: 49.962

2.  MBIR: A cryo-ET 3D reconstruction method that effectively minimizes missing wedge artifacts and restores missing information.

Authors:  Rui Yan; Singanallur V Venkatakrishnan; Jun Liu; Charles A Bouman; Wen Jiang
Journal:  J Struct Biol       Date:  2019-03-11       Impact factor: 2.867

3.  Sparse sampling and reconstruction for an optoacoustic ultrasound volumetric hand-held probe.

Authors:  Mohammad Azizian Kalkhoran; Didier Vray
Journal:  Biomed Opt Express       Date:  2019-03-04       Impact factor: 3.732

Review 4.  Reflections on the value of electron microscopy in the study of heterogeneous catalysts.

Authors:  John Meurig Thomas
Journal:  Proc Math Phys Eng Sci       Date:  2017-01       Impact factor: 2.704

5.  Compressive sensing meets time-frequency: An overview of recent advances in time-frequency processing of sparse signals.

Authors:  Ervin Sejdić; Irena Orović; Srdjan Stanković
Journal:  Digit Signal Process       Date:  2017-08-07       Impact factor: 3.381

6.  Nanomagnetic properties of the meteorite cloudy zone.

Authors:  Joshua F Einsle; Alexander S Eggeman; Ben H Martineau; Zineb Saghi; Sean M Collins; Roberts Blukis; Paul A J Bagot; Paul A Midgley; Richard J Harrison
Journal:  Proc Natl Acad Sci U S A       Date:  2018-11-16       Impact factor: 11.205

Review 7.  Electron Tomography: A Three-Dimensional Analytic Tool for Hard and Soft Materials Research.

Authors:  Peter Ercius; Osama Alaidi; Matthew J Rames; Gang Ren
Journal:  Adv Mater       Date:  2015-06-18       Impact factor: 30.849

8.  Electron tomography simulator with realistic 3D phantom for evaluation of acquisition, alignment and reconstruction methods.

Authors:  Xiaohua Wan; Tsvi Katchalski; Christopher Churas; Sreya Ghosh; Sebastien Phan; Albert Lawrence; Yu Hao; Ziying Zhou; Ruijuan Chen; Yu Chen; Fa Zhang; Mark H Ellisman
Journal:  J Struct Biol       Date:  2017-04-06       Impact factor: 2.867

9.  Making the Most of your Electrons: Challenges and Opportunities in Characterizing Hybrid Interfaces with STEM.

Authors:  Stephanie M Ribet; Akshay A Murthy; Eric W Roth; Roberto Dos Reis; Vinayak P Dravid
Journal:  Mater Today (Kidlington)       Date:  2021-06-19       Impact factor: 31.041

10.  Electron tomography imaging methods with diffraction contrast for materials research.

Authors:  Satoshi Hata; Hiromitsu Furukawa; Takashi Gondo; Daisuke Hirakami; Noritaka Horii; Ken-Ichi Ikeda; Katsumi Kawamoto; Kosuke Kimura; Syo Matsumura; Masatoshi Mitsuhara; Hiroya Miyazaki; Shinsuke Miyazaki; Mitsu Mitsuhiro Murayama; Hideharu Nakashima; Hikaru Saito; Masashi Sakamoto; Shigeto Yamasaki
Journal:  Microscopy (Oxf)       Date:  2020-05-21       Impact factor: 1.571

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