Literature DB >> 23385291

Drift correction in ptychographic diffractive imaging.

Mike Beckers1, Tobias Senkbeil, Thomas Gorniak, Klaus Giewekemeyer, Tim Salditt, Axel Rosenhahn.   

Abstract

X-ray ptychography is a rapidly developing phase retrieval technique that combines the experimental advantages of coherent diffractive imaging with the possibility to image extended specimens. Data collection requires imaging at several scan points with high positional accuracy, which implies susceptibility to mechanical drift. This is a well-known problem in ptychographic scans, which can reduce reconstruction quality and limit the achievable resolution. Using a simple model for positional drift, we show that a set of corrected positions can be found systematically, leading to strong improvements in the reconstruction of a Siemens star dataset severely affected by drift.
Copyright © 2012 Elsevier B.V. All rights reserved.

Year:  2012        PMID: 23385291     DOI: 10.1016/j.ultramic.2012.11.006

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  3 in total

1.  Efficient positional misalignment correction method for Fourier ptychographic microscopy.

Authors:  Jiasong Sun; Qian Chen; Yuzhen Zhang; Chao Zuo
Journal:  Biomed Opt Express       Date:  2016-03-17       Impact factor: 3.732

2.  Coherent imaging at the diffraction limit.

Authors:  Pierre Thibault; Manuel Guizar-Sicairos; Andreas Menzel
Journal:  J Synchrotron Radiat       Date:  2014-08-27       Impact factor: 2.616

3.  Mixed-state electron ptychography enables sub-angstrom resolution imaging with picometer precision at low dose.

Authors:  Zhen Chen; Michal Odstrcil; Yi Jiang; Yimo Han; Ming-Hui Chiu; Lain-Jong Li; David A Muller
Journal:  Nat Commun       Date:  2020-06-12       Impact factor: 14.919

  3 in total

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