| Literature DB >> 22673906 |
Zheng Liu1, Yongjie Zhan, Gang Shi, Simona Moldovan, Mohamed Gharbi, Li Song, Lulu Ma, Wei Gao, Jiaqi Huang, Robert Vajtai, Florian Banhart, Pradeep Sharma, Jun Lou, Pulickel M Ajayan.
Abstract
Building entire multiple-component devices on single nanowires is a promising strategy for miniaturizing electronic applications. Here we demonstrate a single nanowire capacitor with a coaxial asymmetric Cu-Cu(2)O-C structure, fabricated using a two-step chemical reaction and vapour deposition method. The capacitance measured from a single nanowire device corresponds to ~140 μF cm(-2), exceeding previous reported values for metal-insulator-metal micro-capacitors and is more than one order of magnitude higher than what is predicted by classical electrostatics. Quantum mechanical calculations indicate that this unusually high capacitance may be attributed to a negative quantum capacitance of the dielectric-metal interface, enhanced significantly at the nanoscale.Entities:
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Year: 2012 PMID: 22673906 DOI: 10.1038/ncomms1833
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919