Literature DB >> 22590313

Cyclo-hexa-2,5-diene-1,4-dione-1,2,4,5-tetra-fluoro-3,6-diiodo-benzene (1/1).

Peng Liu, Chuansheng Ruan, Tiesheng Li, Baoming Ji.   

Abstract

The asymmetric unit of the title co-crystal adduct, C(6)H(4)O(2)·C(6)F(4)I(2), comprises a half-mol-ecule each of cyclo-hexa-2,5-diene-1,4-dione and 1,2,4,5-tetra-fluoro-3,6-diiodo-benzene. The C(6)F(4)I(2) mol-ecule is almost planar (r.m.s. deviation = 0.0062 Å). In the crystal, the components are connected through O⋯I halogen bonds [3.017 (11) Å], leading to the formation of wavelike chains along the a axis. The crystal packing also features C-H⋯F inter-actions.

Entities:  

Year:  2012        PMID: 22590313      PMCID: PMC3344551          DOI: 10.1107/S1600536812015930

Source DB:  PubMed          Journal:  Acta Crystallogr Sect E Struct Rep Online        ISSN: 1600-5368


Related literature

For related studies on co-crystal formation, see: Bhogala & Nangia (2008) ▶; Ji et al. (2011 ▶); Arman et al. (2010 ▶); Cardillo et al. (2000 ▶). For background to halogen bonding, see: Metrangolo et al. (2008 ▶).

Experimental

Crystal data

C6H4O2·C6F4I2 M = 509.95 Triclinic, a = 5.778 (3) Å b = 6.354 (3) Å c = 10.013 (5) Å α = 102.295 (5)° β = 93.861 (5)° γ = 97.781 (5)° V = 354.1 (3) Å3 Z = 1 Mo Kα radiation μ = 4.48 mm−1 T = 296 K 0.43 × 0.30 × 0.26 mm

Data collection

Bruker APEXII CCD diffractometer Absorption correction: multi-scan (SADABS; Sheldrick, 1996 ▶) T min = 0.249, T max = 0.389 2585 measured reflections 1291 independent reflections 1096 reflections with I > 2σ(I) R int = 0.020

Refinement

R[F 2 > 2σ(F 2)] = 0.033 wR(F 2) = 0.087 S = 1.07 1291 reflections 91 parameters H-atom parameters constrained Δρmax = 1.34 e Å−3 Δρmin = −0.76 e Å−3 Data collection: APEX2 (Bruker, 2004 ▶); cell refinement: SAINT (Bruker, 2004 ▶); data reduction: SAINT; program(s) used to solve structure: SHELXS97 (Sheldrick, 2008 ▶); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008 ▶); molecular graphics: SHELXTL (Sheldrick, 2008 ▶) and DIAMOND (Brandenburg, 2006 ▶); software used to prepare material for publication: SHELXTL and PLATON (Spek, 2009 ▶). Crystal structure: contains datablock(s) global, I. DOI: 10.1107/S1600536812015930/ds2186sup1.cif Structure factors: contains datablock(s) I. DOI: 10.1107/S1600536812015930/ds2186Isup2.hkl Supplementary material file. DOI: 10.1107/S1600536812015930/ds2186Isup3.cml Additional supplementary materials: crystallographic information; 3D view; checkCIF report
C6H4O2·C6F4I2Z = 1
Mr = 509.95F(000) = 234
Triclinic, P1Dx = 2.391 Mg m3
Hall symbol: -P 1Mo Kα radiation, λ = 0.71073 Å
a = 5.778 (3) ÅCell parameters from 1573 reflections
b = 6.354 (3) Åθ = 3.3–25.5°
c = 10.013 (5) ŵ = 4.48 mm1
α = 102.295 (5)°T = 296 K
β = 93.861 (5)°Block, yellow
γ = 97.781 (5)°0.43 × 0.30 × 0.26 mm
V = 354.1 (3) Å3
Bruker APEXII CCD diffractometer1291 independent reflections
Radiation source: fine-focus sealed tube1096 reflections with I > 2σ(I)
Graphite monochromatorRint = 0.020
phi and ω scansθmax = 25.5°, θmin = 3.3°
Absorption correction: multi-scan (SADABS; Sheldrick, 1996)h = −6→6
Tmin = 0.249, Tmax = 0.389k = −7→7
2585 measured reflectionsl = −12→12
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.033Hydrogen site location: inferred from neighbouring sites
wR(F2) = 0.087H-atom parameters constrained
S = 1.07w = 1/[σ2(Fo2) + (0.0571P)2] where P = (Fo2 + 2Fc2)/3
1291 reflections(Δ/σ)max < 0.001
91 parametersΔρmax = 1.34 e Å3
0 restraintsΔρmin = −0.76 e Å3
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.
xyzUiso*/Ueq
C10.3224 (8)0.5732 (8)0.4260 (5)0.0453 (11)
C20.3930 (9)0.3726 (8)0.3786 (5)0.0466 (11)
C30.4339 (9)0.6981 (8)0.5494 (5)0.0501 (12)
C40.5734 (10)0.8493 (9)0.0745 (6)0.0593 (14)
C50.3440 (10)0.8029 (10)−0.0092 (6)0.0652 (15)
H50.24640.6719−0.01410.078*
C60.2763 (10)0.9415 (10)−0.0761 (6)0.0612 (14)
H60.12960.9086−0.12630.073*
F10.2901 (6)0.2428 (6)0.2593 (3)0.0702 (9)
F20.3718 (6)0.8922 (5)0.6021 (4)0.0712 (9)
I10.05048 (6)0.67187 (6)0.31973 (4)0.06065 (19)
O10.6309 (10)0.7170 (8)0.1376 (5)0.0898 (15)
U11U22U33U12U13U23
C10.045 (3)0.048 (3)0.043 (3)0.0023 (19)−0.003 (2)0.014 (2)
C20.047 (3)0.047 (3)0.039 (3)−0.002 (2)−0.007 (2)0.003 (2)
C30.054 (3)0.045 (3)0.047 (3)0.003 (2)0.001 (2)0.004 (2)
C40.064 (3)0.058 (3)0.051 (3)0.022 (3)−0.013 (3)0.000 (3)
C50.062 (3)0.068 (4)0.055 (3)0.004 (3)−0.011 (3)0.001 (3)
C60.054 (3)0.069 (4)0.053 (3)0.020 (3)−0.017 (2)−0.002 (3)
F10.076 (2)0.067 (2)0.0527 (18)0.0096 (16)−0.0214 (16)−0.0097 (15)
F20.084 (2)0.0544 (19)0.068 (2)0.0227 (16)−0.0092 (17)−0.0052 (16)
I10.0554 (3)0.0678 (3)0.0610 (3)0.00885 (17)−0.00837 (17)0.02435 (19)
O10.108 (4)0.073 (3)0.085 (3)0.027 (3)−0.035 (3)0.016 (2)
C1—C31.381 (7)C4—O11.221 (7)
C1—C21.388 (7)C4—C6ii1.483 (9)
C1—I12.079 (5)C4—C51.478 (8)
C2—F11.346 (5)C5—C61.298 (9)
C2—C3i1.373 (8)C5—H50.9300
C3—F21.340 (6)C6—C4ii1.483 (9)
C3—C2i1.373 (8)C6—H60.9300
C3—C1—C2116.9 (5)O1—C4—C6ii123.3 (5)
C3—C1—I1122.0 (4)O1—C4—C5119.7 (6)
C2—C1—I1121.0 (4)C6ii—C4—C5117.0 (5)
F1—C2—C3i118.8 (5)C6—C5—C4121.2 (6)
F1—C2—C1119.7 (4)C6—C5—H5119.4
C3i—C2—C1121.6 (4)C4—C5—H5119.4
F2—C3—C2i118.5 (4)C5—C6—C4ii121.8 (5)
F2—C3—C1120.0 (5)C5—C6—H6119.1
C2i—C3—C1121.6 (5)C4ii—C6—H6119.1
C3—C1—C2—F1179.7 (5)C2—C1—C3—C2i0.2 (8)
I1—C1—C2—F12.5 (7)I1—C1—C3—C2i177.4 (4)
C3—C1—C2—C3i−0.2 (8)O1—C4—C5—C6179.1 (6)
I1—C1—C2—C3i−177.4 (4)C6ii—C4—C5—C6−1.2 (10)
C2—C1—C3—F2−179.0 (5)C4—C5—C6—C4ii1.3 (10)
I1—C1—C3—F2−1.9 (7)
D—H···AD—HH···AD···AD—H···A
C6—H6···F1iii0.932.643.562171
Table 1

Hydrogen-bond geometry (Å, °)

D—H⋯AD—HH⋯ADAD—H⋯A
C6—H6⋯F1i0.932.643.562171

Symmetry code: (i) .

  3 in total

1.  A short history of SHELX.

Authors:  George M Sheldrick
Journal:  Acta Crystallogr A       Date:  2007-12-21       Impact factor: 2.290

2.  1,2,4,5-Tetra-fluoro-3,6-diiodo-benzene-4-(pyridin-4-ylsulfan-yl)pyridine (1/1).

Authors:  Hadi D Arman; Trupta Kaulgud; Edward R T Tiekink
Journal:  Acta Crystallogr Sect E Struct Rep Online       Date:  2010-09-30

3.  Structure validation in chemical crystallography.

Authors:  Anthony L Spek
Journal:  Acta Crystallogr D Biol Crystallogr       Date:  2009-01-20
  3 in total
  1 in total

Review 1.  The Halogen Bond.

Authors:  Gabriella Cavallo; Pierangelo Metrangolo; Roberto Milani; Tullio Pilati; Arri Priimagi; Giuseppe Resnati; Giancarlo Terraneo
Journal:  Chem Rev       Date:  2016-01-26       Impact factor: 60.622

  1 in total

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