| Literature DB >> 22213372 |
Hyobin Yoo1, Kunook Chung, Yong Seok Choi, Chan Soon Kang, Kyu Hwan Oh, Miyoung Kim, Gyu-Chul Yi.
Abstract
Plan-view and cross-sectional transmission electron microscopy images show the microstructural properties of GaN thin films grown on graphene layers, including dislocation types and density, crystalline orientation and grain boundaries. The roles of ZnO nanowalls and GaN intermediate layers in the heteroepitaxial growth of GaN on graphene, revealed by cross-sectional transmission electron microscopy, are also discussed.Entities:
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Year: 2011 PMID: 22213372 DOI: 10.1002/adma.201103829
Source DB: PubMed Journal: Adv Mater ISSN: 0935-9648 Impact factor: 30.849