Linlin Han1, Takashi Okiji. 1. Division of Cariology, Operative Dentistry, and Endodontics, Department of Oral Health Science, Niigata University Graduate School of Medical and Dental Sciences.
Abstract
OBJECTIVE: This study aimed to evaluate a prototype surface reaction-type pre-reacted glass-ionomer (S-PRG) filler-containing endodontic sealer (S-PRG sealer) in terms of its ion-releasing ability and the incorporation of the released ions by root canal dentin. MATERIALS AND METHODS: The concentration of ions in the set S-PRG sealer was measured by ICPS and with a fluoride ion electrode. Element mapping and chemical component bulk analysis of the outermost dentin of the S-PRG sealer-dentin interface were performed by SEM-EPMA. The incorporation depth of the elements in dentin was measured by element line scanning. RESULTS AND DISCUSSION: Ions released from the S-PRG sealer (Al, B, F, Na, Si, Sr, and Zn) were detected over time. The incorporation of fluoride (F), strontium (Sr), silicon (Si), and boron (B) was observed along the outermost dentin of the S-PRG sealer-dentin interface by EPMA analysis, and the incorporation depth increased with prolonged immersion. CONCLUSION: The continuous release of ions from the S-PRG sealer and their subsequent incorporation by root canal dentin were confirmed.
OBJECTIVE: This study aimed to evaluate a prototype surface reaction-type pre-reacted glass-ionomer (S-PRG) filler-containing endodontic sealer (S-PRG sealer) in terms of its ion-releasing ability and the incorporation of the released ions by root canal dentin. MATERIALS AND METHODS: The concentration of ions in the set S-PRG sealer was measured by ICPS and with a fluoride ion electrode. Element mapping and chemical component bulk analysis of the outermost dentin of the S-PRG sealer-dentin interface were performed by SEM-EPMA. The incorporation depth of the elements in dentin was measured by element line scanning. RESULTS AND DISCUSSION: Ions released from the S-PRG sealer (Al, B, F, Na, Si, Sr, and Zn) were detected over time. The incorporation of fluoride (F), strontium (Sr), silicon (Si), and boron (B) was observed along the outermost dentin of the S-PRG sealer-dentin interface by EPMA analysis, and the incorporation depth increased with prolonged immersion. CONCLUSION: The continuous release of ions from the S-PRG sealer and their subsequent incorporation by root canal dentin were confirmed.