| Literature DB >> 21871070 |
Dina V Dudina1, Vyacheslav I Mali, Alexander G Anisimov, Oleg I Lomovsky, Michail A Korchagin, Natalia V Bulina, Maria A Neklyudova, Konstantinos Georgarakis, Alain R Yavari.
Abstract
We have studied the phase and structure evolution of the Ti33Cu67 amorphous alloy subjected to electrical pulses of high current density. By varying the pulse parameters, different stages of crystallization could be observed in the samples. Partial polymorphic nanocrystallization resulting in the formation of 5- to 8-nm crystallites of the TiCu2 intermetallic in the residual amorphous matrix occurred when the maximum current density reached 9.7·108 A m-2 and the pulse duration was 140 μs, though the calculated temperature increase due to Joule heating was not enough to reach the crystallization temperature of the alloy. Samples subjected to higher current densities and higher values of the evolved Joule heat per unit mass fully crystallized and contained the Ti2Cu3 and TiCu3 phases. A common feature of the crystallized ribbons was their non-uniform microstructure with regions that experienced local melting and rapid solidification.PACS: 81; 81.05.Bx; 81.05.Kf.Entities:
Year: 2011 PMID: 21871070 PMCID: PMC3212051 DOI: 10.1186/1556-276X-6-512
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703
Thickness of the Ti33Cu67 ribbon samples, electrical pulsing parameters, calculated current density and Joule heat evolved during the pulses
| Sample | Pulse duration, μs | Maximum | Q/m, J kg-1 | Possible processes in the sample caused by Joule heating | ||
|---|---|---|---|---|---|---|
| N1 | 100 | 140 | 145 | 9.7 · 108 | 5.3 · 104 | Heating up to approximately 480 K |
| N2 | 30 | 230 | 110 | 2.2 · 109 | 3.4 · 105 | Heating up to the solidus temperature, partial melting |
| N3 | 40 | 100 | 284 | 4.7 · 109 | 4.4 · 105 | Heating up to the solidus temperature, partial melting |
| N4 | 25 | 140 | 190 | 5.1 · 109 | 1.0 · 106 | Heating up the liquidus temperature, complete melting |
aCalculated using the maximum current
Figure 1XRD patterns of the initial Ti. (see Table 1).
Figure 2TEM characterization of the Ti. (a) HRTEM micrograph; (b) selected area diffraction pattern; (c) dark-field electron image showing a larger area of the sample.
Figure 3XRD pattern of the Ti.
Figure 4SEM micrograph of the initial amorphous alloy ribbon Ti.
Figure 5SEM micrograph of the Ti. (a, b) N1; (c, d) N2; (e, f) N3; (g, h) conventionally annealed at 773 K.
Figure 6Experimental set-up for applying electrical pulses to thin metallic glass ribbons. R1 is a reference resistor.