| Literature DB >> 21794132 |
Thomas Aj Kuhlbusch1, Christof Asbach, Heinz Fissan, Daniel Göhler, Michael Stintz.
Abstract
Risk, associated with nanomaterial use, is determined by exposure and hazard potential of these materials. Both topics cannot be evaluated absolutely independently. Realistic dose concentrations should be tested based on stringent exposure assessments for the corresponding nanomaterial taking into account also the environmental and product matrix. This review focuses on current available information from peer reviewed publications related to airborne nanomaterial exposure. Two approaches to derive realistic exposure values are differentiated and independently presented; those based on workplace measurements and the others based on simulations in laboratories. An assessment of the current available workplace measurement data using a matrix, which is related to nanomaterials and work processes, shows, that data are available on the likelihood of release and possible exposure. Laboratory studies are seen as an important complementary source of information on particle release processes and hence for possible exposure. In both cases, whether workplace measurements or laboratories studies, the issue of background particles is a major problem. From this review, major areas for future activities and focal points are identified.Entities:
Mesh:
Substances:
Year: 2011 PMID: 21794132 PMCID: PMC3162892 DOI: 10.1186/1743-8977-8-22
Source DB: PubMed Journal: Part Fibre Toxicol ISSN: 1743-8977 Impact factor: 9.400
Selected measurement and sampling devices for airborne particles
| Measurement/sampling device | Size range/time resolution/metric + equivalent diameter | References |
|---|---|---|
| | ||
| Scanning mobility particle sizer (SMPS) | 2.5 nm - 1000 nm | [ |
| Electrometer based mobility particle sizer: | 5.6 nm - 560 nm | [ |
| Electrical low pressure impactor (ELPI) | 6 nm - 10 μm | [ |
| Optical particle sizer (OPS):- laser aerosol spectrometer (LAS) | (> 60 nm) > 300 nm - 20 μm | [ |
| Inertial spectrometer/time of flight instruments: | 500 nm - 20 μm | [ |
| | ||
| Low pressure cascade impactor | > 20 nm | [ |
| Micro orifice uniform deposit impactor (Moudi) | 10 nm -20 μm | [ |
| Wide range aerosol system (WRAS) | 5.5 nm - 32 μm | [ |
| Thermal precipitator (TP) | 20 - ca. 300 nm | [ |
| | ||
| Condensation particle counter (CPC) | 5.5 nm - 9 μm | [ |
| Surface area monitors (e.g. electrical aerosol detector (EAD), nanoparticle surface area monitor (NSAM), LQ1-DC) | 10 nm - > 1 μm | [ |
| Aerosol photometer | 250 nm - 20 μm | |
| | ||
| Electrostatic precipitator (ESP) | > 20 nm | [ |
| Thermal precipitator (TP) | > 20 nm | [ |
| Filtration (e.g. PM10, PM2.5) | mass concentration, chemical composition | |
Measurement Strategies for background distinction (only articles with original measurements)
| With/without activity | With/without nanomaterial | |
|---|---|---|
| Time series analysis | [ | [ |
| Time series and, or only spatial analysis | [ | |
1: Only in some cases
2: Additional background distinction by chemical analysis (filtration sample or single particle analysis)
3: Additional TEM or SEM analysis
4: Nearly clean room conditions: [4], not in table
List of workplace processes and nanomaterials being investigated for possible exposure
| Nanomaterial | Production | Handling & refinement | Bagging & shipping | Processing | |
|---|---|---|---|---|---|
| Powder or suspension | In a fixed matrix | ||||
| Carbon Black | [ | [ | [ | [ | |
| CNT, CNF, fullerenes | [ | [ | [ | [ | [ |
| Ag | [ | [ | [ | ||
| TiO2 | [ | [ | |||
| SiO2 | [ | [ | [ | [ | |
| Al2O3 | [ | [ | [ | [ | |
| Metals | [ | [ | [ | [ | |
| Metal oxides | [ | [ | [ | [ | |
| Others | [ | [ | [ | [ | |
Summary of the workplace related exposure studies
| Workplace | Type of activity | Nanomaterial | Metric | Results - remarks | |
|---|---|---|---|---|---|
| [ | Industrial production | Bagging areas of three plants | Carbon black | PSD(15-675 nm); MC; NC; CC | No significant release of nanoparticles detected, release of agglomerates (> 400 nm) of nanoparticles in all cases of bagging detected if open systems were used; Other sources also significantly influence nanoscale particle concentrations |
| [ | Industrial production | Production and pelletizer areas of three plants | Carbon black | PSD(15-675 nm);MC;NC; CC | Significant release of nanoparticles (> 106 #/cm³) and their agglomerates detected in case of a leak in the pelletizing area; in case of good maintenance no significant release of NP from closed production and pelletizing processes; other sources significantly influenced particle number concentrations |
| [ | Toner and printing inks industry | Bag emptying of powders | Fumed silica | NC (< 1 μm); PSD (< 1 μm); ASA (< 1 μm); morph.; CC | Significantly increased1 NC (> 100 nm) and ASA detected during bag emptying; confirmed by TEM analysis |
| [ | Industrial manufacturing plant | Manual packaging, warehouse, pelletizing | carbon black | PSD (< 1 μm); LDSA (< 1 μm) | Higher NC and LDSA concentrations during activity than during non-activity |
| [ | Industrial manufacturing facility | Liquid phase process, drying, grinding, handling, | Silver | PSD (15 nm-675 nm); morph | Significant release of particles < 100 nm as well as of agglomerates was observed during all processing steps as soon as the reactor, dryer and grinder were opened, leading to possible exposure even for wet production processes |
| [ | Industrial production | Metalloxide production (gas burner) and embedding into a porous oxide matrix, bagging, handling, cleaning and maintenance | MeO (no further information) | NC (10-1000 nm) PSD (14-760 nm), MC PM1 (0.1-1000 nm). | Long term study on possible release of nanomaterial; Significant release of nanomaterial by 'open' production line, handling and cleaning < 1000 nm; Increased NC < 100 nm concurrent with production activity. |
| [ | Small commercial nanotechnology production facility | Production of fullerenes (arc reaction), sweeping, vacuum cleaning | Fullerenes | PSD (14 nm - 673 nm), PM2.5 MC, PAH MC | Slightly elevated NC in work area compared to background at one day out of 4 possibly related to cleaning of fume hood; Very good containment of the nanomaterial in the fume hood (production and handling area) |
| [ | Industrial production | Wet mill | Lithium titanate metal oxides | NC (10-1000 nm), PSD (300 nm - 10 μm)MC (respirable fraction), CC, morph. | Only large agglomerates have been detected |
| [ | Industrial production | Bagging and agitation including use of vacuum cleaner during these work steps | Fullerenes | PDS (15 nm-10 μm), morph | Release of particles < 100 nm were observed during bagging and vacuum cleaning; also release of particles > 2 μm was observed during all work steps, including agitation. |
| [ | Industrial production | Production and processing (bagging, handling CNF in dryer, thermal treatment, removal from dryer) | Carbon nanofibers | NC; MC respirable; ASA; photoelectric response; CO and CO2 | Elevated NC and MC indicate release of significant amounts of nanoscale particles and their agglomerates; no definite indication on release of single and agglomerated carbon nanofibres. |
| [ | Industrial production pilot plant, Industry processing | Production and maintenance (silicon), extrusion of CNT nanocomposites | Silicon; CNT | PSD (5-600 nm); NC; ASA | No changes in PSD and NC was observed during production, but spikes during cleaning of mostly agglomerated silicon (> 200 nm); High NC concentration observed in the extrusion area, but no specific CNT detection method was employed; |
| [ | Industrial manufacturing | Production, filtration, bagging | TiO2, Al2O3 | PSD (5-600 nm); MC PM1; CC, morph | Wet and combustion production processes were compared and no significant release of particles < 100 nm observed; in one case a bag was overfilled and release of agglomerates > 400 nm observed |
| [ | Simulated industry workplace | Compounding of nanocomposites with nanoscale alumina | Al2O3 | PSD (5.6-560 nm), morph. | Significant release, confirmed by STEM analysis |
| [ | Laboratory and industrial production facility | Normal activities during batchwise production of SWCNT: collection, removal, cleaning, opening container, vacuum cleaning | SWCNT | NC (10-1000 nm), MC (size fraction not indicated), morph, CC | Likeliness of CNT exposure during production given; period of exposure relatively short (ca. 1 h) but concentration are sometimes high the exposure nearly pure nanomaterial. |
| [ | Laboratory to industrial workplace | Synthesis of nanoobjects, handling and production of composite materials | CNT, CNF, Carbon Nanopearls, fullerenes, TiO2, Ag, Mn, Co-oxide, Fe-oxide, Al, SiFe, QDs | NC (15-1000 nm) for screening, PSD (300-1000 nm), MC, CC (not size selective) | Increased NC in all three investigated size classes (10-1000 nm, 300-500 nm, 500-1000 nm) indicate Release of nanomaterial during various of the investigated sites; no systematic analysis of the results is presented |
| [ | Research Laboratory for use of carbon based ENMs | Transfer of CNMs; sonication in environmentally relevant matrices | Fullerenes, MWCNT; carbon black | PSD (300 - 10,000 nm); NC (10 - 1,000 nm) | Each activity resulted in increased particle number concentrations; TEM images clearly show CNM |
| [ | Research laboratories | Scalable flame spray pyrolysis | NaCl, BiPO4, CaSO4, Bi2O3, TiO2, SiO2, WO3, Cu/ZN, Cu/SiO2, Cu/ZrO2, Ta2O5/SiO2, Pt/Ba/Al2O3 | PSD (15-675 nm); NC (> 7 nm; > 10 nm), MC (< 1 μm; < 10 μm) | Concentration in near field and far field higher than in background in 40% of measured cases |
| [ | Research laboratories | Plasma enhanced CVD; PVD; compounding of polymers with nanofillers | Nanofillers (not further specified) | PSD (5 nm - 20 μm); NC (< 370 nm) | Increased concentrations detected, but likely not caused by ENP release |
| [ | Laboratory scale production | Machining/cutting | CNT hybrid composites | NC, PSD (5 nm - 20 μm), morph, PM10 MC | Small increases in NC during wet cutting, significant increases (ca. 300,000 #/cm³) during dry cutting; fibres detected in concentrations of 1-4 fibres/cm³ during dry cutting. |
| [ | Various2 | Mixing of powder and liquid; filling/emptying oven; suspension spraying; flame spraying | TnO, ZnO, InZnO, SiO2 | PSD (14 nm-20 μm), NC (< 1 μm), MC (respirable and inhalable) | No evidence of release of ZnO and InZnO during handling; very high concentrations during spraying of silane and flame spraying of SiO2 suspension |
| [ | Laboratory scale production | Production by chemical vapour deposition (CVD) | SWCNT, MWCNT | PSD (5 nm - 20 μm); morph | SWCNT and MWCNT release was determined in the production area in the fume hood, depending on process conditions; No significant amounts of CNT were detected in the breathing zone of a worker and the background. |
| [ | Laboratory scale production and handling | Weighing, mixing with solvent, cutting | raw CNF and CNF composite | NC (10-1000 nm); PSD (10 nm - 10 μm); ASA; morph | Slight increases in NC for weighing, mixing of CNF and wet cutting. TEM picture reveal the release of CNF during these processes. Minor airborne CNF concentration during normal handling; Main increase in PSD for sizes < 400 nm. |
| [ | Laboratory handling | Handling in fume hoods of nanomaterial powders, pouring, transferring | Al2O3, Silver | PSD (5-600 nm); morph | increased NC in the breathing zone of a worker mainly in size range > 100 nm but also partially < 100 nm during handling activity; |
| [ | Laboratory scale production and handling | Growth, removal, shaving and transfer of CVD derived CNT | CNT | PSD (5-600 nm); NC (10-1000 nm); TP, ESP; MC | Neither TEM nor NC analysis reveal a release of CNT during these processes |
| [ | Laboratory and industrial production | Four production facilities (2 × TiO2 by combustion, Ag by plasma and in liquid via citrate), collection of powders in fume hood and in liquid | TiO2, Silver | PSD (15-710 nm); MC; CC, morph | Lowest number concentration detection for in liquid production, higher particle number concentrations during combustion but also release from electro engines and other side activities |
Studies focused on the particle release of ENMs by laboratory testing (column 1 indicates the different subcategorisations)
| Study | Process | Materials | Instrumentation | Metric | Results |
|---|---|---|---|---|---|
| [ | Rotating drum test (free fall, stirring, ...) | TiO2 (Aeroxide P25), ZnO | SMPS, APS, MOUDI | PSD (15 nm - 20 μm), NC, DI | < 10% particles < 100 nm60% particles < 1 μm |
| [ | Rotating drum test (free fall, stirring, ...) | TiO2, SiO2, FeO(OH), Mg3Si4O10(OH)2, Al2O3 | FMPS, APS, Filtration | PSD (5.6 nm - 20 μm), NRP (0.5 μm - 20 μm), NRP (5.6 nm - 560 nm), DI | Undefined fraction of particles < 100 nm |
| [ | Rotating drum test (free fall, stirring, ...) | Organoclay, Bentonite | FMPS, APS, Filtration | PSD (5.6 nm-20 μm), NRP (0.5 μm - 20 μm), NRP (5.6 nm - 560 nm), DI | Undefined fraction of particles < 100 nm |
| [ | Free fall | TiO2 (G5), SiO2 (Aerosil 200) | ELPI; SEM (ELPI) | PSD(30 nm - 10 μm), MC, MC/M | Fraction of particles < 100 nm |
| [ | Fluidized bed | TiO2 (Aeroxide P25) | SMPS (LDMA, NDMA), APS; TEM (ESP) | PSD (4 nm - 20 μm)/NCmax | 10% particles < 100 nm |
| [ | Vortex shaker (fluidized bed, agitation) | SWCNT, alumina powder | SMPS (LDMA, NDMA), APS | PSD (4 nm - 20 μm), NC | Fraction of particles < 100 nm, alumina powder released more NP than SWCNT |
| [ | Vortex shaker (fluidized bed) | SWCNT, MWCNT, TiO2, ZnO | SMPS, HHCPC, APS, OPC | PSD (10 nm - 20 μm), NC (10 nm - > 1 μm)/V, NC (10 nm - > 1 μm)/M | Fraction of particles < 100 nm |
| [ | Shaker method | MWCNT | SMPS, APS, TEM(ESP, CI) | PSD (14 nm - 20 μm), NC(dt) | Fraction of particles < 100 nm; |
| [ | Fluidized bed with oscillating sieve plate | MWCNT | SMPS, SEM (TP) | PSD (< 1 μm), NC(dt) | Fraction of particles < 100 nm |
| [ | Stirring and dispersing in orifice (leak in pressurized vessel) | TiO2, CeO2, SrCO3, TiZrAlO | SMPS | PSD (14 nm - 736 nm), fractions, relative values | Increase of the fraction of ENPs by increase of the overpressure (up to 12%) |
| [ | Weighing/transferring of powders and sonication of suspensions | fullerenes, MWCNT, CB | HHCPC, HHPC, TEM-EDX (filtration) | PSD (0,3 μm - 10 μm), NC (10 nm - 1 μm) | Suspension sonication leads to droplets with embedded ENM |
| [ | Spraying | suspensions with and without Ag | SMPS, TEM(ESP) | PSD (10 nm - 500 nm), NC (< 100 nm), NC(< 500 nm) | High fraction of particles < 100 nm |
| [ | Weak abrasion process (Taber Abraser) | PVC layer with/without ENPs (nanoclay) | SMPS, CPC | PSD (5 nm-1 μm) | |
| [ | Weak abrasion process (Taber Abraser) | coatings with/without ENPs (ZnO) | SMPS, CPC; SEM/TEM-EDX (ESP) | PSD (16 nm - 626 nm), NC (> 6 nm), wear mass | Very low concentrations, ENPs still embedded |
| [ | UV light, wind erosion, scrabing | coatings with TiO2 | SMPS | PSD (15 nm - 661 nm), NC (15 nm - 661 nm) | Comparison with non-doped samples is missing |
| [ | Shaving (razor blade) | CNT | FMPS, HHCPC, SEM & TEM - EDX (TP) | NC (10 nm -1 μm), PSD (5.6 nm-560 nm) | No significant change in concentration; no free CNTs were observed |
| [ | Sanding process (orbital sander) | coatings with/without ENPs (TiO2, CB, SiO2, CaCO3) | FMPS, APS(ESP) | PSD (5.6 nm-20 μm) | General release of NP, spark particles contamination |
| [ | Sanding process (Dremel) | coatings with/without ENPs (ZnO, Fe2O3) | FMPS, CPC, OPCSEM/TEM-EDX (ESP) | PSD (5.6 nm-20 μm), NC (< 100 nm), NRP (< 100 nm), NRP (< 10 μm), swarf mass; material, morphology | General release of NP but ENPs still embedded in the matrix |
| [ | UV-light; weak abrasion process (Taber Abraser); customized sanding | POM with/without CNT, PA with/without SiO2, cement with/without CNT, cement with/without CSH | SMPS, UNPA, SEM, AUC, XPS, SIMS | PSD (14 nm-820 nm), Morphologie, material | No free SiO2-particles or CNTs detected |
| [ | Dry and wet cutting (band-saw; rotatory cutting wheel) | composites with and without CNT | FMPS, APS, HHCPC, DT, SEM/TEM-EDX (ESP, TP) | PSD (5.6 nm-20 μm), NC (5.6 nm - 560 nm), | No free CNTs observed |
| [ | Dry and wet solid core drilling | Composites with and without CNT | FMPS, APS, HHCPC, DT, DC, SEM/TEM-EDX (ESP, TP) WRASS+ICP-MS | PSD (5.6 nm-20 μm), NC, MC (< 35 μm), SA; material; morphology | Smoke generation, free CNT clusters observed |