Literature DB >> 21754891

2-Chloro-5-chloro-meth-yl-1,3-thia-zole.

Ling-Ling Zhao, Wei-Hua Cheng, Zhao-Sheng Cai.   

Abstract

In the title compound, C(4)H(3)Cl(2)NS, the chloro-methyl C and 2-position Cl atoms lie close to the mean plane of the thia-zole ring [deviations = 0.0568 (2) and 0.0092 (1) Å, respectively]. No classical hydrogen bonds are found in the crystal structure.

Entities:  

Year:  2011        PMID: 21754891      PMCID: PMC3120493          DOI: 10.1107/S1600536811019052

Source DB:  PubMed          Journal:  Acta Crystallogr Sect E Struct Rep Online        ISSN: 1600-5368


Related literature

The title compound is an inter­mediate in the manufacture of agrochemicals, see: Kozo et al. (1986 ▶). For the synthesis of the title compound, see: Beck & Heitzer (1988 ▶); For bond-length data, see: Allen et al. (1987 ▶).

Experimental

Crystal data

C4H3Cl2NS M = 168.03 Monoclinic, a = 4.2430 (8) Å b = 17.151 (3) Å c = 9.1640 (18) Å β = 96.82 (3)° V = 662.2 (2) Å3 Z = 4 Mo Kα radiation μ = 1.18 mm−1 T = 293 K 0.30 × 0.20 × 0.10 mm

Data collection

Enraf–Nonius CAD-4 diffractometer Absorption correction: ψ scan (North et al., 1968 ▶) T min = 0.718, T max = 0.891 2697 measured reflections 1211 independent reflections 932 reflections with I > 2σ(I) R int = 0.060 3 standard reflections every 200 reflections intensity decay: 1%

Refinement

R[F 2 > 2σ(F 2)] = 0.043 wR(F 2) = 0.151 S = 1.00 1211 reflections 74 parameters H-atom parameters constrained Δρmax = 0.30 e Å−3 Δρmin = −0.28 e Å−3 Data collection: CAD-4 Software (Enraf–Nonius, 1985 ▶); cell refinement: CAD-4 Software; data reduction: XCAD4 (Harms & Wocadlo, 1995 ▶); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008 ▶); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008 ▶); molecular graphics: SHELXTL (Sheldrick, 2008 ▶); software used to prepare material for publication: SHELXTL. Crystal structure: contains datablocks I, global. DOI: 10.1107/S1600536811019052/vm2096sup1.cif Structure factors: contains datablocks I. DOI: 10.1107/S1600536811019052/vm2096Isup2.hkl Supplementary material file. DOI: 10.1107/S1600536811019052/vm2096Isup3.cml Additional supplementary materials: crystallographic information; 3D view; checkCIF report
C4H3Cl2NSF(000) = 336
Mr = 168.03Dx = 1.686 Mg m3
Monoclinic, P21/cMo Kα radiation, λ = 0.71073 Å
Hall symbol: -P 2ybcCell parameters from 25 reflections
a = 4.2430 (8) Åθ = 10–13°
b = 17.151 (3) ŵ = 1.18 mm1
c = 9.1640 (18) ÅT = 293 K
β = 96.82 (3)°Block, colourless
V = 662.2 (2) Å30.30 × 0.20 × 0.10 mm
Z = 4
Enraf–Nonius CAD-4 diffractometer932 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tubeRint = 0.060
graphiteθmax = 25.4°, θmin = 2.4°
ω/2θ scansh = 0→5
Absorption correction: ψ scan (North et al., 1968)k = −20→20
Tmin = 0.718, Tmax = 0.891l = −11→10
2697 measured reflections3 standard reflections every 200 reflections
1211 independent reflections intensity decay: 1%
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.043H-atom parameters constrained
wR(F2) = 0.151w = 1/[σ2(Fo2) + (0.098P)2] where P = (Fo2 + 2Fc2)/3
S = 1.00(Δ/σ)max < 0.001
1211 reflectionsΔρmax = 0.30 e Å3
74 parametersΔρmin = −0.28 e Å3
0 restraintsExtinction correction: SHELXS97 (Sheldrick, 2008), Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
Primary atom site location: structure-invariant direct methodsExtinction coefficient: 0.030 (8)
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.
xyzUiso*/Ueq
S0.3422 (2)0.57491 (5)0.76517 (10)0.0589 (4)
N0.5235 (10)0.71113 (19)0.8427 (3)0.0725 (10)
Cl10.7424 (3)0.60986 (7)1.04471 (11)0.0811 (5)
C10.5381 (9)0.6400 (2)0.8830 (3)0.0530 (9)
Cl20.2025 (2)0.58243 (7)0.38099 (10)0.0671 (4)
C20.2262 (8)0.6502 (2)0.6483 (3)0.0484 (8)
C30.3450 (12)0.7162 (2)0.7087 (4)0.0684 (11)
H3A0.30780.76390.66150.082*
C40.0159 (10)0.6382 (2)0.5089 (4)0.0637 (10)
H4A−0.04430.68860.46600.076*
H4B−0.17610.61190.52970.076*
U11U22U33U12U13U23
S0.0750 (7)0.0467 (5)0.0523 (6)−0.0053 (4)−0.0033 (4)0.0014 (4)
N0.109 (3)0.0552 (18)0.0516 (18)−0.016 (2)0.0015 (18)−0.0070 (14)
Cl10.0967 (9)0.0963 (9)0.0464 (6)0.0075 (6)−0.0078 (5)0.0011 (5)
C10.065 (2)0.055 (2)0.0386 (17)−0.0016 (17)0.0064 (15)−0.0013 (14)
Cl20.0682 (7)0.0810 (7)0.0494 (6)−0.0024 (5)−0.0041 (4)−0.0146 (4)
C20.0480 (19)0.0554 (19)0.0427 (17)0.0070 (15)0.0090 (14)0.0017 (14)
C30.102 (3)0.0468 (19)0.055 (2)0.003 (2)0.005 (2)0.0037 (17)
C40.057 (2)0.076 (2)0.057 (2)0.0128 (19)0.0042 (18)−0.0003 (19)
S—C11.700 (4)C2—C31.333 (5)
S—C21.712 (3)C2—C41.482 (5)
N—C11.275 (5)C3—H3A0.9300
N—C31.367 (5)C4—H4A0.9700
Cl1—C11.705 (3)C4—H4B0.9700
Cl2—C41.772 (4)
C1—S—C289.16 (17)C2—C3—H3A121.3
C1—N—C3108.9 (3)N—C3—H3A121.3
N—C1—S116.2 (3)C2—C4—Cl2112.0 (3)
N—C1—Cl1122.9 (3)C2—C4—H4A109.2
S—C1—Cl1120.9 (2)Cl2—C4—H4A109.2
C3—C2—C4129.4 (3)C2—C4—H4B109.2
C3—C2—S108.3 (3)Cl2—C4—H4B109.2
C4—C2—S122.3 (3)H4A—C4—H4B107.9
C2—C3—N117.5 (3)
C3—N—C1—S0.0 (5)C4—C2—C3—N177.2 (4)
C3—N—C1—Cl1179.6 (3)S—C2—C3—N0.0 (5)
C2—S—C1—N0.0 (4)C1—N—C3—C20.0 (6)
C2—S—C1—Cl1−179.6 (2)C3—C2—C4—Cl2116.5 (4)
C1—S—C2—C30.0 (3)S—C2—C4—Cl2−66.6 (4)
C1—S—C2—C4−177.4 (3)
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