Literature DB >> 21654038

Use of a Bayesian maximum-likelihood classifier to generate training data for brain-machine interfaces.

Kip A Ludwig1, Rachel M Miriani, Nicholas B Langhals, Timothy C Marzullo, Daryl R Kipke.   

Abstract

Brain-machine interface decoding algorithms need to be predicated on assumptions that are easily met outside of an experimental setting to enable a practical clinical device. Given present technological limitations, there is a need for decoding algorithms which (a) are not dependent upon a large number of neurons for control, (b) are adaptable to alternative sources of neuronal input such as local field potentials (LFPs), and (c) require only marginal training data for daily calibrations. Moreover, practical algorithms must recognize when the user is not intending to generate a control output and eliminate poor training data. In this paper, we introduce and evaluate a Bayesian maximum-likelihood estimation strategy to address the issues of isolating quality training data and self-paced control. Six animal subjects demonstrate that a multiple state classification task, loosely based on the standard center-out task, can be accomplished with fewer than five engaged neurons while requiring less than ten trials for algorithm training. In addition, untrained animals quickly obtained accurate device control, utilizing LFPs as well as neurons in cingulate cortex, two non-traditional neural inputs.

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Year:  2011        PMID: 21654038      PMCID: PMC3145156          DOI: 10.1088/1741-2560/8/4/046009

Source DB:  PubMed          Journal:  J Neural Eng        ISSN: 1741-2552            Impact factor:   5.379


  54 in total

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Authors:  Gopal Santhanam; Stephen I Ryu; Byron M Yu; Afsheen Afshar; Krishna V Shenoy
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Authors:  Mijail D Serruya; Nicholas G Hatsopoulos; Liam Paninski; Matthew R Fellows; John P Donoghue
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Authors:  Philip R Kennedy; M Todd Kirby; Melody M Moore; Brandon King; Adon Mallory
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3.  Design Choices for Next-Generation Neurotechnology Can Impact Motion Artifact in Electrophysiological and Fast-Scan Cyclic Voltammetry Measurements.

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