| Literature DB >> 21635106 |
Pascal Steiner1, Enrico Gnecco, Franciszek Krok, Janusz Budzioch, Lukasz Walczak, Jerzy Konior, Marek Szymonski, Ernst Meyer.
Abstract
We report on high-resolution friction force microscopy on a stepped NaCl(001) surface in ultrahigh vacuum. The measurements were performed on single cleavage step edges. When blunt tips are used, friction is found to increase while scanning both up and down a step edge. With atomically sharp tips, friction still increases upwards, but it decreases and even changes sign downwards. Our observations extend previous results obtained without resolving atomic features and are associated with the competition between the Schwöbel barrier and the asymmetric potential well accompanying the step edges.Entities:
Year: 2011 PMID: 21635106 DOI: 10.1103/PhysRevLett.106.186104
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161