Literature DB >> 21582926

4-Bromo-seleno-anisole.

Henning Osholm Sørensen, Nicolai Stuhr-Hansen.   

Abstract

The title compound, 1-bromo-4-methyl-seleno-benzene, C(7)H(7)BrSe, was prepared by methyl-ation of 4-bromo-seleno-phenolate with methyl iodide, and crystals suitable for structure determination were obtained by sublimation. The mol-ecule is essentially planar; the Se-Me bond is rotated by only 2.59 (19)° out of the least-squares plane of the benzene ring. The most pronounced intermolecular interactions are two hydrogen bonds of the type C-H⋯π, which determine a herring-bone pattern in the crystal packing.

Entities:  

Year:  2009        PMID: 21582926      PMCID: PMC2969389          DOI: 10.1107/S160053680902296X

Source DB:  PubMed          Journal:  Acta Crystallogr Sect E Struct Rep Online        ISSN: 1600-5368


Related literature

For related selenobenzene structures, see: Oddershede et al. (2003 ▶); Sørensen & Stuhr-Hansen (2009 ▶); Stuhr-Hansen et al. (2009 ▶). For the 77Se-NMR spctrum, see: Eggert et al. (1986 ▶). For the melting point, see: Gilow et al. (1968 ▶).

Experimental

Crystal data

C7H7BrSe M = 250.00 Orthorhombic, a = 5.8298 (8) Å b = 7.0671 (11) Å c = 18.776 (6) Å V = 773.6 (3) Å3 Z = 4 Cu Kα radiation μ = 11.86 mm−1 T = 122 K 0.36 × 0.09 × 0.09 mm

Data collection

Enraf–Nonius CAD-4 diffractometer Absorption correction: numerical (DeTitta, 1985 ▶) T min = 0.145, T max = 0.454 5823 measured reflections 1590 independent reflections 1590 reflections with I > 2σ(I) R int = 0.031 5 standard reflections frequency: 166.7 min intensity decay: 8.7%

Refinement

R[F 2 > 2σ(F 2)] = 0.027 wR(F 2) = 0.075 S = 1.15 1590 reflections 83 parameters 1 restraint H-atom parameters constrained Δρmax = 0.62 e Å−3 Δρmin = −1.30 e Å−3 Absolute structure: Flack (1983 ▶) Flack parameter: −0.01 (4) Data collection: CAD-4 EXPRESS (Enraf–Nonius, 1994 ▶); cell refinement: CAD-4 EXPRESS; data reduction: DREAR (Blessing, 1987 ▶); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008 ▶); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008 ▶); molecular graphics: ORTEPII (Johnson, 1976 ▶) and PLATON (Spek, 2009 ▶); software used to prepare material for publication: SHELXL97. Crystal structure: contains datablocks I, global. DOI: 10.1107/S160053680902296X/fj2225sup1.cif Structure factors: contains datablocks I. DOI: 10.1107/S160053680902296X/fj2225Isup2.hkl Additional supplementary materials: crystallographic information; 3D view; checkCIF report
C7H7BrSeF(000) = 472
Mr = 250.00Dx = 2.147 Mg m3
Orthorhombic, Pna21Cu Kα radiation, λ = 1.54184 Å
Hall symbol: P 2c -2nCell parameters from 20 reflections
a = 5.8298 (8) Åθ = 39.2–40.3°
b = 7.0671 (11) ŵ = 11.86 mm1
c = 18.776 (6) ÅT = 122 K
V = 773.6 (3) Å3Needle, white
Z = 40.36 × 0.09 × 0.09 mm
Enraf–Nonius CAD-4 diffractometer1590 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tubeRint = 0.031
graphiteθmax = 74.8°, θmin = 4.7°
ω–2θ scansh = −7→7
Absorption correction: numerical (DeTitta, 1985)k = −8→8
Tmin = 0.145, Tmax = 0.454l = −23→23
5823 measured reflections5 standard reflections every 166.7 min
1590 independent reflections intensity decay: 8.7%
Refinement on F2Hydrogen site location: inferred from neighbouring sites
Least-squares matrix: fullH-atom parameters constrained
R[F2 > 2σ(F2)] = 0.027w = 1/[σ2(Fo2) + (0.0537P)2 + 0.4964P] where P = (Fo2 + 2Fc2)/3
wR(F2) = 0.075(Δ/σ)max < 0.001
S = 1.15Δρmax = 0.62 e Å3
1590 reflectionsΔρmin = −1.29 e Å3
83 parametersExtinction correction: SHELXL97 (Sheldrick, 2008), Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
1 restraintExtinction coefficient: 0.0128 (5)
Primary atom site location: heavy-atom methodAbsolute structure: Flack (1983)
Secondary atom site location: difference Fourier mapFlack parameter: −0.01 (4)
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.
xyzUiso*/Ueq
Se1−0.08215 (7)0.05711 (4)0.00008 (2)0.02110 (15)
Br10.38155 (8)−0.04502 (5)0.317143 (19)0.02756 (16)
C10.0636 (7)0.0211 (5)0.0905 (2)0.0176 (7)
C2−0.0585 (6)0.0834 (5)0.1507 (2)0.0185 (7)
H2−0.20550.13950.14500.022*
C30.0336 (8)0.0636 (4)0.2178 (2)0.0219 (8)
H3−0.04780.10660.25860.026*
C40.2483 (6)−0.0207 (5)0.22490 (18)0.0184 (7)
C50.3691 (6)−0.0843 (5)0.1666 (2)0.0184 (7)
H50.5149−0.14200.17270.022*
C60.2759 (7)−0.0633 (4)0.0982 (2)0.0193 (8)
H60.3579−0.10670.05770.023*
C70.1556 (9)−0.0397 (6)−0.0615 (3)0.0300 (9)
H7A0.29970.0268−0.05170.045*
H7B0.1117−0.0195−0.11130.045*
H7C0.1759−0.1753−0.05280.045*
U11U22U33U12U13U23
Se10.0191 (2)0.0252 (2)0.0190 (2)0.00090 (10)−0.00294 (17)0.00115 (15)
Br10.0276 (2)0.0363 (3)0.0188 (2)0.00065 (13)−0.00506 (19)0.00065 (16)
C10.0174 (18)0.0161 (14)0.0193 (18)−0.0014 (12)−0.0005 (13)0.0019 (13)
C20.0120 (15)0.0178 (15)0.026 (2)0.0030 (12)0.0026 (13)−0.0003 (13)
C30.022 (2)0.0201 (16)0.024 (2)0.0001 (11)0.0034 (17)−0.0019 (12)
C40.0186 (19)0.0202 (16)0.0166 (17)−0.0032 (12)−0.0007 (15)0.0015 (12)
C50.0168 (15)0.0206 (14)0.0177 (18)−0.0018 (12)0.0009 (13)−0.0014 (13)
C60.0170 (19)0.0178 (16)0.0230 (19)0.0009 (10)0.0012 (16)−0.0022 (11)
C70.032 (2)0.039 (2)0.019 (2)0.0061 (15)0.0035 (18)−0.0038 (14)
Se1—C11.916 (4)C3—H30.9500
Se1—C71.930 (5)C4—C51.377 (5)
Br1—C41.906 (4)C5—C61.401 (6)
C1—C61.382 (5)C5—H50.9500
C1—C21.406 (5)C6—H60.9500
C2—C31.377 (6)C7—H7A0.9800
C2—H20.9500C7—H7B0.9800
C3—C41.392 (6)C7—H7C0.9800
C1—Se1—C799.5 (2)C4—C5—C6119.7 (3)
C6—C1—C2120.3 (4)C4—C5—H5120.2
C6—C1—Se1123.2 (3)C6—C5—H5120.2
C2—C1—Se1116.5 (3)C1—C6—C5119.3 (4)
C3—C2—C1120.4 (4)C1—C6—H6120.4
C3—C2—H2119.8C5—C6—H6120.4
C1—C2—H2119.8Se1—C7—H7A109.5
C2—C3—C4118.8 (4)Se1—C7—H7B109.5
C2—C3—H3120.6H7A—C7—H7B109.5
C4—C3—H3120.6Se1—C7—H7C109.5
C5—C4—C3121.6 (3)H7A—C7—H7C109.5
C5—C4—Br1119.0 (3)H7B—C7—H7C109.5
C3—C4—Br1119.5 (3)
C7—Se1—C1—C6−3.0 (3)C2—C3—C4—Br1178.8 (3)
C7—Se1—C1—C2177.8 (3)C3—C4—C5—C60.4 (6)
C6—C1—C2—C31.0 (5)Br1—C4—C5—C6−178.5 (3)
Se1—C1—C2—C3−179.8 (3)C2—C1—C6—C5−0.7 (5)
C1—C2—C3—C4−0.6 (5)Se1—C1—C6—C5−179.8 (3)
C2—C3—C4—C5−0.1 (5)C4—C5—C6—C10.0 (5)
D—H···AD—HH···AD···AD—H···A
C2—H2···C2i0.952.843.747 (4)159
C5—H5···C5ii0.952.833.740 (5)160
Table 1

Selected bond lengths (Å)

Se1—C11.916 (4)
Se1—C71.930 (5)
Br1—C41.906 (4)
Table 2

Hydrogen-bond geometry (Å, °)

D—H⋯AD—HH⋯ADAD—H⋯A
C2—H2⋯C2i0.952.843.747 (4)159
C5—H5⋯C5ii0.952.833.740 (5)160

Symmetry codes: (i) ; (ii) .

  4 in total

1.  A short history of SHELX.

Authors:  George M Sheldrick
Journal:  Acta Crystallogr A       Date:  2007-12-21       Impact factor: 2.290

2.  1,4-Bis(4-chloro-phenyl-seleno)-2,5-di-methoxy-benzene.

Authors:  Henning Osholm Sørensen; Nicolai Stuhr-Hansen
Journal:  Acta Crystallogr Sect E Struct Rep Online       Date:  2008-12-03

3.  Relations between 77Se NMR chemical shifts of (phenylseleno)-benzenes and their molecular structures derived from nine X-ray crystal structures.

Authors:  Jette Oddershede; Lars Henriksen; Sine Larsen
Journal:  Org Biomol Chem       Date:  2003-03-21       Impact factor: 3.876

4.  Structure validation in chemical crystallography.

Authors:  Anthony L Spek
Journal:  Acta Crystallogr D Biol Crystallogr       Date:  2009-01-20
  4 in total

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