Literature DB >> 21581591

1,4-Bis(4-chloro-phenyl-seleno)-2,5-di-methoxy-benzene.

Henning Osholm Sørensen, Nicolai Stuhr-Hansen.   

Abstract

The title compound, C(20)H(16)Cl(2)O(2)Se(2), utilizes the symmetry of the crystallographic inversion center. Mol-ecular chains are formed through symmetric C-H⋯Cl inter-actions around inversion centers, mimicking the commonly observed symmetric hydrogen-bonded dimer pattern often found in carboxylic acids.

Entities:  

Year:  2008        PMID: 21581591      PMCID: PMC2967934          DOI: 10.1107/S1600536808039469

Source DB:  PubMed          Journal:  Acta Crystallogr Sect E Struct Rep Online        ISSN: 1600-5368


Related literature

For background to the electrophilic aryl­selenylation of reactive arenes, see: Santi et al. (2008 ▶); Nicolaou et al. (1979 ▶); Gassman et al. (1982 ▶); Yoshida et al. (1991 ▶); Tiecco et al. (1994 ▶); Engman & Eriksson (1996 ▶); Henriksen (1994 ▶); Henriksen & Stuhr-Hansen (1998 ▶). For related structures, see: Oddershede et al. (2003 ▶). For related supra­molecular patterns, see: Gavezzotti & Filippini (1994 ▶); Allen et al. (1999 ▶); Sørensen & Larsen (2003 ▶); Sørensen et al. (1999 ▶).

Experimental

Crystal data

C20H16Cl2O2Se2 M = 517.15 Monoclinic, a = 11.7737 (17) Å b = 6.6535 (6) Å c = 13.438 (5) Å β = 114.136 (16)° V = 960.7 (4) Å3 Z = 2 Cu Kα radiation μ = 7.47 mm−1 T = 122 (1) K 0.44 × 0.15 × 0.13 mm

Data collection

Enraf–Nonius CAD-4 diffractometer Absorption correction: gaussian (DeTitta, 1985 ▶). T min = 0.242, T max = 0.796 2641 measured reflections 1976 independent reflections 1919 reflections with I > 2σ(I) R int = 0.030 5 standard reflections frequency: 166.7 min intensity decay: 5.7%

Refinement

R[F 2 > 2σ(F 2)] = 0.028 wR(F 2) = 0.075 S = 1.10 1976 reflections 119 parameters H-atom parameters constrained Δρmax = 0.59 e Å−3 Δρmin = −1.20 e Å−3 Data collection: CAD-4 EXPRESS (Enraf–Nonius, 1994 ▶); cell refinement: CAD-4 EXPRESS; data reduction: DREAR (Blessing, 1987 ▶); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008 ▶); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008 ▶); molecular graphics: PLATON (Spek, 2003 ▶); software used to prepare material for publication: SHELXL97. Crystal structure: contains datablocks global, I. DOI: 10.1107/S1600536808039469/sg2281sup1.cif Structure factors: contains datablocks I. DOI: 10.1107/S1600536808039469/sg2281Isup2.hkl Additional supplementary materials: crystallographic information; 3D view; checkCIF report
C20H16Cl2O2Se2F(000) = 508
Mr = 517.15Dx = 1.788 Mg m3
Monoclinic, P21/nMelting point: 193 K
Hall symbol: -P 2ynCu Kα radiation, λ = 1.54184 Å
a = 11.7737 (17) ÅCell parameters from 20 reflections
b = 6.6535 (6) Åθ = 39.3–40.7°
c = 13.438 (5) ŵ = 7.47 mm1
β = 114.136 (16)°T = 122 K
V = 960.7 (4) Å3Block, white
Z = 20.44 × 0.15 × 0.13 mm
Enraf–Nonius CAD-4 diffractometer1919 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tubeRint = 0.030
graphiteθmax = 74.9°, θmin = 4.2°
ω–2θ scansh = −14→14
Absorption correction: gaussian (DeTitta, 1985).k = −7→8
Tmin = 0.242, Tmax = 0.796l = 0→16
2641 measured reflections5 standard reflections every 166.7 min
1976 independent reflections intensity decay: 5.7%
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.028H-atom parameters constrained
wR(F2) = 0.076w = 1/[σ2(Fo2) + (0.0433P)2 + 0.9774P] where P = (Fo2 + 2Fc2)/3
S = 1.10(Δ/σ)max < 0.001
1976 reflectionsΔρmax = 0.60 e Å3
119 parametersΔρmin = −1.20 e Å3
0 restraintsExtinction correction: SHELXL97 (Sheldrick, 2008), Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
Primary atom site location: structure-invariant direct methodsExtinction coefficient: 0.0029 (3)
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.
xyzUiso*/Ueq
Se10.745362 (19)0.19839 (3)0.007848 (17)0.01812 (12)
Cl1.00097 (5)0.82041 (8)0.40315 (5)0.02427 (15)
O11.23891 (13)0.1213 (2)0.13084 (12)0.0192 (3)
C11.2567 (2)0.2869 (3)0.20396 (19)0.0232 (5)
H1A1.34590.31400.24310.035*
H1B1.22130.25350.25640.035*
H1C1.21500.40630.16230.035*
C21.11846 (19)0.0668 (3)0.06767 (16)0.0160 (4)
C31.0144 (2)0.1577 (3)0.07253 (17)0.0168 (4)
H31.02450.26530.12190.020*
C40.89557 (19)0.0910 (3)0.00514 (16)0.0159 (4)
C50.82080 (19)0.3830 (3)0.12694 (17)0.0172 (4)
C60.8614 (2)0.3181 (3)0.23448 (19)0.0194 (4)
H60.85060.18150.24930.023*
C70.9173 (2)0.4513 (3)0.32023 (17)0.0197 (4)
H70.94570.40670.39360.024*
C80.93109 (19)0.6504 (3)0.29699 (17)0.0174 (4)
C90.8891 (2)0.7196 (3)0.19057 (19)0.0211 (5)
H90.89850.85700.17620.025*
C100.8331 (2)0.5850 (3)0.10537 (17)0.0201 (4)
H100.80300.63080.03210.024*
U11U22U33U12U13U23
Se10.01674 (16)0.01956 (17)0.01817 (16)0.00021 (7)0.00723 (11)−0.00363 (7)
Cl0.0267 (3)0.0243 (3)0.0206 (3)−0.0041 (2)0.0084 (2)−0.00601 (18)
O10.0174 (7)0.0196 (7)0.0194 (7)−0.0023 (6)0.0063 (6)−0.0059 (6)
C10.0242 (11)0.0227 (11)0.0217 (11)−0.0045 (9)0.0084 (9)−0.0084 (8)
C20.0178 (9)0.0154 (9)0.0145 (9)−0.0025 (8)0.0064 (7)0.0012 (7)
C30.0215 (10)0.0136 (9)0.0164 (9)−0.0016 (8)0.0089 (8)−0.0014 (7)
C40.0192 (9)0.0143 (9)0.0156 (9)0.0004 (7)0.0084 (8)0.0013 (7)
C50.0169 (9)0.0178 (10)0.0196 (10)0.0013 (8)0.0103 (8)−0.0016 (8)
C60.0211 (10)0.0160 (10)0.0216 (11)0.0022 (8)0.0091 (9)0.0024 (8)
C70.0208 (10)0.0215 (11)0.0170 (9)0.0033 (8)0.0080 (8)0.0037 (8)
C80.0169 (9)0.0173 (10)0.0189 (10)0.0001 (8)0.0080 (8)−0.0038 (8)
C90.0255 (11)0.0163 (10)0.0213 (11)−0.0001 (8)0.0093 (9)0.0018 (8)
C100.0245 (11)0.0196 (10)0.0170 (10)0.0017 (8)0.0093 (8)0.0031 (8)
Se1—C41.921 (2)C4—C2i1.398 (3)
Se1—C51.923 (2)C5—C61.393 (3)
Cl—C81.741 (2)C5—C101.395 (3)
O1—C21.371 (2)C6—C71.388 (3)
O1—C11.433 (2)C6—H60.9500
C1—H1A0.9800C7—C81.386 (3)
C1—H1B0.9800C7—H70.9500
C1—H1C0.9800C8—C91.387 (3)
C2—C31.391 (3)C9—C101.389 (3)
C2—C4i1.398 (3)C9—H90.9500
C3—C41.392 (3)C10—H100.9500
C3—H30.9500
C4—Se1—C597.92 (9)C6—C5—Se1120.74 (16)
C2—O1—C1116.88 (17)C10—C5—Se1119.64 (16)
O1—C1—H1A109.5C7—C6—C5120.6 (2)
O1—C1—H1B109.5C7—C6—H6119.7
H1A—C1—H1B109.5C5—C6—H6119.7
O1—C1—H1C109.5C8—C7—C6118.9 (2)
H1A—C1—H1C109.5C8—C7—H7120.6
H1B—C1—H1C109.5C6—C7—H7120.6
O1—C2—C3124.29 (19)C7—C8—C9121.7 (2)
O1—C2—C4i115.37 (18)C7—C8—Cl119.75 (17)
C3—C2—C4i120.34 (19)C9—C8—Cl118.60 (17)
C2—C3—C4120.07 (19)C8—C9—C10119.0 (2)
C2—C3—H3120.0C8—C9—H9120.5
C4—C3—H3120.0C10—C9—H9120.5
C3—C4—C2i119.60 (19)C9—C10—C5120.3 (2)
C3—C4—Se1123.88 (16)C9—C10—H10119.9
C2i—C4—Se1116.50 (15)C5—C10—H10119.9
C6—C5—C10119.6 (2)
C1—O1—C2—C3−1.8 (3)C10—C5—C6—C7−2.0 (3)
C1—O1—C2—C4i178.06 (18)Se1—C5—C6—C7179.10 (16)
O1—C2—C3—C4−179.78 (19)C5—C6—C7—C80.6 (3)
C4i—C2—C3—C40.4 (3)C6—C7—C8—C90.8 (3)
C2—C3—C4—C2i−0.4 (3)C6—C7—C8—Cl179.98 (16)
C2—C3—C4—Se1177.83 (15)C7—C8—C9—C10−0.7 (3)
C5—Se1—C4—C3−3.27 (19)Cl—C8—C9—C10−179.91 (17)
C5—Se1—C4—C2i174.97 (16)C8—C9—C10—C5−0.8 (3)
C4—Se1—C5—C6−83.67 (18)C6—C5—C10—C92.1 (3)
C4—Se1—C5—C1097.46 (18)Se1—C5—C10—C9−179.02 (17)
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