Literature DB >> 21580429

2-Iodo-4,6-dimethyl-pyrimidine.

Qing-Min Jiang, Gui-Yun Mao, Lu-Ye Hao, Xin-Qi Hao, Mao-Ping Song.   

Abstract

In the title compound, C(6)H(7)IN(2), the non-H atoms of the mol-ecule are located on a crystallographic mirror plane; the H atoms of the methyl groups are therefore disordered over two positions of equal occupancy. In the crystal structure, short inter-molecular I⋯N contacts [3.390 (3) Å] are found, linking the mol-ecules into zigzag chains. In addition, there are inter-molecular π-π stacking inter-actions between the pyrimidine rings of adjacent mol-ecules [centroid-centroid distance = 3.5168 (10) Å], resulting in a two-dimensional supra-molecular architecture.

Entities:  

Year:  2010        PMID: 21580429      PMCID: PMC2983557          DOI: 10.1107/S1600536810005660

Source DB:  PubMed          Journal:  Acta Crystallogr Sect E Struct Rep Online        ISSN: 1600-5368


Related literature

For applications of pyrimidine derivatives, see: Chinchilla et al. (2004 ▶); Xu et al. (2009a ▶,b ▶). For halogen–electronegative atom inter­actions, see: Lommerse et al. (1996 ▶). For the synthesis of 4,6-dimethyl-2-chloro­pyrimidine, see: Kosolapoff & Roy (1961 ▶) and literature cited therein.

Experimental

Crystal data

C6H7IN2 M = 234.04 Orthorhombic, a = 7.930 (2) Å b = 7.0256 (19) Å c = 14.499 (4) Å V = 807.8 (4) Å3 Z = 4 Mo Kα radiation μ = 3.88 mm−1 T = 296 K 0.32 × 0.25 × 0.21 mm

Data collection

Bruker SMART APEXII CCD area-detector diffractometer Absorption correction: multi-scan (SADABS; Sheldrick, 1996 ▶) T min = 0.370, T max = 0.496 5541 measured reflections 817 independent reflections 739 reflections with I > 2σ(I) R int = 0.029

Refinement

R[F 2 > 2σ(F 2)] = 0.026 wR(F 2) = 0.066 S = 1.10 817 reflections 57 parameters H-atom parameters constrained Δρmax = 0.81 e Å−3 Δρmin = −0.21 e Å−3 Data collection: APEX2 (Bruker, 2004 ▶); cell refinement: SAINT (Bruker, 2004 ▶); data reduction: SAINT; program(s) used to solve structure: SHELXS97 (Sheldrick, 2008 ▶); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008 ▶); molecular graphics: SHELXTL (Sheldrick, 2008 ▶); software used to prepare material for publication: SHELXL97. Crystal structure: contains datablocks global, I. DOI: 10.1107/S1600536810005660/si2242sup1.cif Structure factors: contains datablocks I. DOI: 10.1107/S1600536810005660/si2242Isup2.hkl Additional supplementary materials: crystallographic information; 3D view; checkCIF report
C6H7IN2Dx = 1.924 Mg m3
Mr = 234.04Mo Kα radiation, λ = 0.71073 Å
Orthorhombic, PnmaCell parameters from 2976 reflections
a = 7.930 (2) Åθ = 2.8–24.9°
b = 7.0256 (19) ŵ = 3.88 mm1
c = 14.499 (4) ÅT = 296 K
V = 807.8 (4) Å3Block, colourless
Z = 40.32 × 0.25 × 0.21 mm
F(000) = 440
Bruker SMART APEXII CCD area-detector diffractometer817 independent reflections
Radiation source: fine-focus sealed tube739 reflections with I > 2σ(I)
graphiteRint = 0.029
phi and ω scansθmax = 25.5°, θmin = 2.8°
Absorption correction: multi-scan (SADABS; Sheldrick, 1996)h = −9→9
Tmin = 0.370, Tmax = 0.496k = −8→8
5541 measured reflectionsl = −17→17
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.026Hydrogen site location: inferred from neighbouring sites
wR(F2) = 0.066H-atom parameters constrained
S = 1.10w = 1/[σ2(Fo2) + (0.0375P)2 + 0.259P] where P = (Fo2 + 2Fc2)/3
817 reflections(Δ/σ)max = 0.001
57 parametersΔρmax = 0.81 e Å3
0 restraintsΔρmin = −0.21 e Å3
Geometry. All esds (except the esd in the dihedral angle between two l.s. planes)are estimated using the full covariance matrix. The cell esds are takeninto account individually in the estimation of esds in distances, anglesand torsion angles; correlations between esds in cell parameters are onlyused when they are defined by crystal symmetry. An approximate (isotropic)treatment of cell esds is used for estimating esds involving l.s. planes.
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR andgoodness of fit S are based on F2, conventional R-factors R are basedon F, with F set to zero for negative F2. The threshold expression ofF2 > σ(F2) is used only for calculating R-factors(gt) etc. and isnot relevant to the choice of reflections for refinement. R-factors basedon F2 are statistically about twice as large as those based on F, and R-factors based on ALL data will be even larger.
xyzUiso*/UeqOcc. (<1)
C10.4205 (6)0.25000.4216 (3)0.0559 (10)
C20.4224 (8)0.25000.5763 (3)0.0708 (13)
C30.5963 (8)0.25000.5741 (3)0.0746 (14)
H30.65870.25000.62850.090*
C40.6751 (7)0.25000.4899 (3)0.0680 (12)
C50.3278 (11)0.25000.6665 (5)0.108 (2)
H5A0.22990.17030.66120.162*0.50
H5B0.29350.37750.68120.162*0.50
H5C0.39960.20220.71450.162*0.50
C60.8651 (8)0.25000.4820 (5)0.107 (2)
H6A0.90470.12150.47610.161*0.50
H6B0.91320.30680.53610.161*0.50
H6C0.89800.32180.42860.161*0.50
I10.27885 (5)0.25000.29859 (2)0.07396 (18)
N10.3314 (6)0.25000.4980 (2)0.0656 (9)
N20.5862 (5)0.25000.4101 (2)0.0616 (9)
U11U22U33U12U13U23
C10.063 (3)0.046 (2)0.058 (2)0.000−0.002 (2)0.000
C20.107 (4)0.047 (2)0.058 (3)0.0000.007 (3)0.000
C30.106 (4)0.059 (3)0.059 (3)0.000−0.014 (3)0.000
C40.076 (3)0.064 (3)0.064 (3)0.000−0.012 (2)0.000
C50.158 (7)0.098 (4)0.068 (3)0.0000.022 (4)0.000
C60.073 (4)0.151 (6)0.098 (4)0.000−0.014 (3)0.000
I10.0685 (3)0.0874 (3)0.0660 (3)0.000−0.01043 (13)0.000
N10.075 (2)0.065 (2)0.057 (2)0.0000.0106 (19)0.000
N20.064 (2)0.062 (2)0.059 (2)0.000−0.0017 (17)0.000
C1—N11.314 (6)C4—N21.356 (6)
C1—N21.325 (6)C4—C61.511 (9)
C1—I12.108 (4)C5—H5A0.9600
C2—N11.345 (7)C5—H5B0.9600
C2—C31.380 (9)C5—H5C0.9600
C2—C51.507 (8)C6—H6A0.9600
C3—C41.371 (7)C6—H6B0.9600
C3—H30.9300C6—H6C0.9600
N1—C1—N2129.8 (4)C2—C5—H5B109.5
N1—C1—I1115.3 (3)H5A—C5—H5B109.5
N2—C1—I1114.9 (3)C2—C5—H5C109.5
N1—C2—C3121.1 (5)H5A—C5—H5C109.5
N1—C2—C5117.7 (6)H5B—C5—H5C109.5
C3—C2—C5121.2 (6)C4—C6—H6A109.5
C4—C3—C2118.4 (5)C4—C6—H6B109.5
C4—C3—H3120.8H6A—C6—H6B109.5
C2—C3—H3120.8C4—C6—H6C109.5
N2—C4—C3121.6 (5)H6A—C6—H6C109.5
N2—C4—C6116.9 (4)H6B—C6—H6C109.5
C3—C4—C6121.5 (5)C1—N1—C2115.1 (5)
C2—C5—H5A109.5C1—N2—C4114.1 (4)
N1—C2—C3—C40.0C3—C2—N1—C10.0
C5—C2—C3—C4180.0C5—C2—N1—C1180.0
C2—C3—C4—N20.0N1—C1—N2—C40.0
C2—C3—C4—C6180.0I1—C1—N2—C4180.0
N2—C1—N1—C20.0C3—C4—N2—C10.00
I1—C1—N1—C2180.0C6—C4—N2—C1180.0
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Authors:  Rafael Chinchilla; Carmen Nájera; Miguel Yus
Journal:  Chem Rev       Date:  2004-05       Impact factor: 60.622

2.  A short history of SHELX.

Authors:  George M Sheldrick
Journal:  Acta Crystallogr A       Date:  2007-12-21       Impact factor: 2.290

3.  4,6-Dimethyl-2-p-tolyl-pyrimidine.

Authors:  Chen Xu; Zhi-Qiang Wang; Fei-Fei Cen; Lin Cheng; Bao-Ming Ji
Journal:  Acta Crystallogr Sect E Struct Rep Online       Date:  2009-10-17
  3 in total

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