| Literature DB >> 21258143 |
Gilberto Medeiros-Ribeiro1, Frederick Perner, Richard Carter, Hisham Abdalla, Matthew D Pickett, R Stanley Williams.
Abstract
We measured the switching time statistics for a TiO(2) memristor and found that they followed a lognormal distribution, which is a potentially serious problem for computer memory and data storage applications. We examined the underlying physical phenomena that determine the switching statistics and proposed a simple analytical model for the distribution based on the drift/diffusion equation and previously measured nonlinear drift behavior. We designed a closed-loop switching protocol that dramatically narrows the time distribution, which can significantly improve memory circuit performance and reliability.Entities:
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Year: 2011 PMID: 21258143 DOI: 10.1088/0957-4484/22/9/095702
Source DB: PubMed Journal: Nanotechnology ISSN: 0957-4484 Impact factor: 3.874