Literature DB >> 21231763

Interplay of conductance, force, and structural change in metallic point contacts.

Markus Ternes1, César González, Christopher P Lutz, Prokop Hapala, Franz J Giessibl, Pavel Jelínek, Andreas J Heinrich.   

Abstract

The coupling between two atomically sharp nanocontacts provides tunable access to a fundamental underlying interaction: the formation of the bond between two atoms as they are brought into contact. Here we report a detailed experimental and theoretical analysis of the relation between the chemical force and the tunneling current during bond formation in atom-scale metallic junctions and their dependence on distance, junction structure, and material. We found that the short-range force as well as the conductance in two prototypical metal junctions depend exponentially on the distance and that they have essentially the same exponents. In the transition regime between tunneling and point contact, large short-range forces generate structural relaxations which are concomitant with modifications of the surface electronic structure and the collapse of the tunneling barrier.

Entities:  

Year:  2011        PMID: 21231763     DOI: 10.1103/PhysRevLett.106.016802

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  15 in total

Review 1.  Single-molecule junctions beyond electronic transport.

Authors:  Sriharsha V Aradhya; Latha Venkataraman
Journal:  Nat Nanotechnol       Date:  2013-06       Impact factor: 39.213

2.  Force-induced tautomerization in a single molecule.

Authors:  Janina N Ladenthin; Thomas Frederiksen; Mats Persson; John C Sharp; Sylwester Gawinkowski; Jacek Waluk; Takashi Kumagai
Journal:  Nat Chem       Date:  2016-07-04       Impact factor: 24.427

3.  Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique.

Authors:  Zsolt Majzik; Martin Setvín; Andreas Bettac; Albrecht Feltz; Vladimír Cháb; Pavel Jelínek
Journal:  Beilstein J Nanotechnol       Date:  2012-03-15       Impact factor: 3.649

4.  Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe.

Authors:  Adam Sweetman; Sam Jarvis; Rosanna Danza; Philip Moriarty
Journal:  Beilstein J Nanotechnol       Date:  2012-01-09       Impact factor: 3.649

5.  Nano-contact microscopy of supracrystals.

Authors:  Adam Sweetman; Nicolas Goubet; Ioannis Lekkas; Marie Paule Pileni; Philip Moriarty
Journal:  Beilstein J Nanotechnol       Date:  2015-05-29       Impact factor: 3.649

6.  Identifying tips for intramolecular NC-AFM imaging via in situ fingerprinting.

Authors:  Hongqian Sang; Samuel P Jarvis; Zhichao Zhou; Peter Sharp; Philip Moriarty; Jianbo Wang; Yu Wang; Lev Kantorovich
Journal:  Sci Rep       Date:  2014-10-20       Impact factor: 4.379

7.  Local stiffness and work function variations of hexagonal boron nitride on Cu(111).

Authors:  Abhishek Grewal; Yuqi Wang; Matthias Münks; Klaus Kern; Markus Ternes
Journal:  Beilstein J Nanotechnol       Date:  2021-06-17       Impact factor: 3.649

8.  Characterization of the mechanical properties of qPlus sensors.

Authors:  Jan Berger; Martin Svec; Martin Müller; Martin Ledinský; Antonín Fejfar; Pavel Jelínek; Zsolt Majzik
Journal:  Beilstein J Nanotechnol       Date:  2013-01-02       Impact factor: 3.649

9.  Chemical control of electrical contact to sp² carbon atoms.

Authors:  Thomas Frederiksen; Giuseppe Foti; Fabrice Scheurer; Virginie Speisser; Guillaume Schull
Journal:  Nat Commun       Date:  2014-04-16       Impact factor: 14.919

10.  Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces.

Authors:  Adam Sweetman; Andrew Stannard
Journal:  Beilstein J Nanotechnol       Date:  2014-04-01       Impact factor: 3.649

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