| Literature DB >> 21230849 |
D Löffler1, J J Uhlrich, M Baron, B Yang, X Yu, L Lichtenstein, L Heinke, C Büchner, M Heyde, S Shaikhutdinov, H-J Freund, R Włodarczyk, M Sierka, J Sauer.
Abstract
Thin SiO₂ films were grown on a Ru(0001) single crystal and studied by photoelectron spectroscopy, infrared spectroscopy and scanning probe microscopy. The experimental results in combination with density functional theory calculations provide compelling evidence for the formation of crystalline, double-layer sheet silica weakly bound to a metal substrate.Entities:
Year: 2010 PMID: 21230849 DOI: 10.1103/PhysRevLett.105.146104
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161