| Literature DB >> 27381580 |
Ting Ting Song1, Ming Yang2,3, Jian Wei Chai2, Martin Callsen4, Jun Zhou4, Tong Yang2,3, Zheng Zhang2, Ji Sheng Pan2, Dong Zhi Chi2, Yuan Ping Feng4, Shi Jie Wang2.
Abstract
The miniaturization of future electronic devices requires the knowledge of interfacial properties between two-dimensional channel materials and high-κ dielectrics in the limit of one atomic layer thickness. In this report, by combining particle-swarm optimization method with first-principles calculations, we present a detailed study of structural, electronic, mechanical, and dielectric properties of Al2O3 monolayer. We predict that planar Al2O3 monolayer is globally stable with a direct band gap of 5.99 eV and thermal stability up to 1100 K. The stability of this high-κ oxide monolayer can be enhanced by substrates such as graphene, for which the interfacial interaction is found to be weak. The band offsets between the Al2O3 monolayer and graphene are large enough for electronic applications. Our results not only predict a stable high-κ oxide monolayer, but also improve the understanding of interfacial properties between a high-κ dielectric monolayer and two-dimensional material.Entities:
Year: 2016 PMID: 27381580 PMCID: PMC4933898 DOI: 10.1038/srep29221
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1(a) Top view of the most stable configuration of Al2O3 monolayer from the PSO prediction. (b) Equation of states of the Al2O3 monolayer, in which the inset is the top view of a unit cell for the Al2O3 monolayer. Contour plot of the ELF along Al-O bonding plane for (c) Al2O3 monolayer and (d) α-Al2O3 bulk.
Figure 2(a) Phonon dispersion of the planar Al2O3 monolayer. (b) The energy evolution and (c) the evolution of Al-O bond during the 10 ps MD simulation at room temperature, in which the bond variation is defined as the difference between the Al-O bond length in MD simulations and its equilibrium bond length. (d) The side view for the Al2O3 monolayer with the maximum bond displacement during 10 ps the MD simulation.
The elastic constant, Young’s modulus, and Poisson’s ratio of Al2O3 monolayer, graphene, BN monolayer, and ZnO monolayer.
| Al2O3 monolayer | 87.75 | 59.35 | 47.6 | 0.676 | this work |
| Graphene | 353.675 | 62.195 | 342.7 | 0.176 | this work |
| 352 | 62.6 | 340.8 | 0.178 | ref. | |
| 353 | 61 | 342 | 0.17 | ref. | |
| 358.1 | 60.4 | 348 | 0.17 | ref. | |
| BN-monolayer | 288.26 | 63.54 | 274.3 | 0.22 | this work |
| 293.2 | 66.1 | 278.3 | 0.225 | ref. | |
| 290 | 64 | 276 | 0.22 | ref. | |
| ZnO monolayer | 85.34 | 56.54 | 47.88 | 0.663 | this work |
| 86 | 57.3 | 47.8 | 0.667 | ref. |
Figure 3(a) The HSE06 hybrid functionals calculated band structure and (b) the projected density of states of the Al2O3 (111) monolayer. The Fermi level is shifted to 0 eV. The contour plot of partial charge density (c) near the conduction band minimum and (d) near the valence band maximum for the Al2O3 (111) monolayer.
Figure 4The HSE06 hybrid functionals calculated dielectric function of the Al2O3 monolayer: (a) real part and (b) imaginary part.
Figure 5(a) Top view of the most stable interface structure of the Al2O3 monolayer on graphene imposed with contour plot charge density difference projected on the graphene plane. The blue color denotes the excess charge, and the red color denotes the depleted charge. (b) The band structure of the Al2O3 monolayer on graphene, where the black lines denote the contribution from graphene, the red solid dots denote the contribution from O atoms, and the blue square lattices denote the contribution from Al atom. The Fermi energy is shifted to 0 eV.